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Results: 1-10 |
Results: 10
ULTRALOW ENERGY SECONDARY-ION MASS-SPECTROMETRY AND TRANSIENT YIELDS AT THE SILICON SURFACE
Authors: DOWSETT MG ORMSBY TJ COOKE GA CHU DP
Citation: Mg. Dowsett et al., ULTRALOW ENERGY SECONDARY-ION MASS-SPECTROMETRY AND TRANSIENT YIELDS AT THE SILICON SURFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 302-305
QUANTIFICATION OF SECONDARY-ION-MASS SPECTROSCOPY DEPTH PROFILES USING MAXIMUM-ENTROPY DECONVOLUTION WITH A SAMPLE INDEPENDENT RESPONSE FUNCTION
Authors: DOWSETT MG CHU DP
Citation: Mg. Dowsett et Dp. Chu, QUANTIFICATION OF SECONDARY-ION-MASS SPECTROSCOPY DEPTH PROFILES USING MAXIMUM-ENTROPY DECONVOLUTION WITH A SAMPLE INDEPENDENT RESPONSE FUNCTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 377-381
MC3D - A 3-DIMENSIONAL MONTE-CARLO SYSTEM SIMULATING IMAGE-CONTRAST IN SURFACE ANALYTICAL SCANNING ELECTRON-MICROSCOPY - I - OBJECT-ORIENTED SOFTWARE-DESIGN AND TESTS
Authors: YAN H ELGOMATI MM PRUTTON M WILKINSON DK CHU DP DOWSETT MG
Citation: H. Yan et al., MC3D - A 3-DIMENSIONAL MONTE-CARLO SYSTEM SIMULATING IMAGE-CONTRAST IN SURFACE ANALYTICAL SCANNING ELECTRON-MICROSCOPY - I - OBJECT-ORIENTED SOFTWARE-DESIGN AND TESTS, Scanning, 20(6), 1998, pp. 465-484
DOPANT SPATIAL DISTRIBUTIONS - SAMPLE-INDEPENDENT RESPONSE FUNCTION AND MAXIMUM-ENTROPY RECONSTRUCTION
Authors: CHU DP DOWSETT MG
Citation: Dp. Chu et Mg. Dowsett, DOPANT SPATIAL DISTRIBUTIONS - SAMPLE-INDEPENDENT RESPONSE FUNCTION AND MAXIMUM-ENTROPY RECONSTRUCTION, Physical review. B, Condensed matter, 56(23), 1997, pp. 15167-15170
CHARACTERIZATION OF THE NOISE IN SECONDARY-ION MASS-SPECTROMETRY DEPTH PROFILES
Authors: CHU DP DOWSETT MG COOKE GA
Citation: Dp. Chu et al., CHARACTERIZATION OF THE NOISE IN SECONDARY-ION MASS-SPECTROMETRY DEPTH PROFILES, Journal of applied physics, 80(12), 1996, pp. 7104-7107
THEORETICAL INVESTIGATION OF COSI2 SI1-XGEX DETECTORS - INFLUENCE OF A SI TUNNELING BARRIER ON THE ELECTROOPTICAL CHARACTERISTICS/
Authors: CHU DP PEETERS FM KOLODINSKI S ROCA E
Citation: Dp. Chu et al., THEORETICAL INVESTIGATION OF COSI2 SI1-XGEX DETECTORS - INFLUENCE OF A SI TUNNELING BARRIER ON THE ELECTROOPTICAL CHARACTERISTICS/, Journal of applied physics, 79(2), 1996, pp. 1151-1156
NONINVASIVE MEASUREMENT OF THE INTRINSIC QUANTUM HALL-EFFECT
Authors: CHU DP BUTCHER PN
Citation: Dp. Chu et Pn. Butcher, NONINVASIVE MEASUREMENT OF THE INTRINSIC QUANTUM HALL-EFFECT, Physical review letters, 72(23), 1994, pp. 3698-3701
A NEW DEFINITION OF THE LOCAL CHEMICAL-POTENTIAL IN A SEMICONDUCTOR NANOSTRUCTURE
Authors: BUTCHER PN CHU DP
Citation: Pn. Butcher et Dp. Chu, A NEW DEFINITION OF THE LOCAL CHEMICAL-POTENTIAL IN A SEMICONDUCTOR NANOSTRUCTURE, Journal of physics. Condensed matter, 5(48), 1993, pp. 633-635
QUENCHING OF THE QUANTUM HALL-EFFECT IN A UNIFORM BALLISTIC QUANTUM-WIRE
Authors: CHU DP BUTCHER PN
Citation: Dp. Chu et Pn. Butcher, QUENCHING OF THE QUANTUM HALL-EFFECT IN A UNIFORM BALLISTIC QUANTUM-WIRE, Journal of physics. Condensed matter, 5(33), 1993, pp. 397-404
INTRINSIC INTEGER QUANTUM HALL-EFFECT IN A QUANTUM WIRE
Authors: CHU DP BUTCHER PN
Citation: Dp. Chu et Pn. Butcher, INTRINSIC INTEGER QUANTUM HALL-EFFECT IN A QUANTUM WIRE, Physical review. B, Condensed matter, 47(15), 1993, pp. 10008-10011
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