Authors: RUDY AS CHURILOV AB

Citation: As. Rudy et Ab. Churilov, RESONANCE METHOD FOR IR SENSING, Infrared physics & technology, 39(7), 1998, pp. 433-441

Authors: BACHURIN VI LEPSHIN PA SMIRNOV VK CHURILOV AB

Citation: Vi. Bachurin et al., INFRARED-SPECTROSCOPY OF A SILICON SURFACE BOMBARDED BY NITROGEN-IONS, Technical physics letters, 24(3), 1998, pp. 214-216

Authors: BUCHIN EY CHURILOV AB PROKAZNIKOV AV

Citation: Ey. Buchin et al., DIFFERENT MORPHOLOGY ASPECTS OF N-TYPE POROUS SILICON, Applied surface science, 102, 1996, pp. 431-435

Authors: BUCHIN EY POSTNIKOV AV PROKAZNIKOV AV SVETOVOI VB CHURILOV AB

Citation: Ey. Buchin et al., EFFECT OF TREATMENT MODES ON MORPHOLOGY A ND OPTICAL-PROPERTIES OF N-TYPE POROUS SILICON, Pis'ma v Zurnal tehniceskoj fiziki, 21(1), 1995, pp. 60-65

Authors: ASNIN VM AVERKIEV NS CHURILOV AB MARKOV II MOKROUSOV NE SILOV AY STEPANOV VI

Citation: Vm. Asnin et al., QUANTUM-SIZE EFFECT IN THE PHOTOLUMINESCENCE OF POROUS SILICON LAYERS, Solid state communications, 87(9), 1993, pp. 817-820