Authors:
SINNOTT SB
COLTON RJ
WHITE CT
SHENDEROVA OA
BRENNER DW
HARRISON JA
Citation: Sb. Sinnott et al., ATOMISTIC SIMULATIONS OF THE NANOMETER-SCALE INDENTATION OF AMORPHOUS-CARBON THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 936-940
Citation: Dr. Baselt et al., BIOSENSOR BASED ON FORCE MICROSCOPE TECHNOLOGY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 789-793
Citation: Ja. Dagata et al., 2ND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY GAITHERSBURG, MD MAY 2-3, 1995 - ABSTRACTS, Journal of research of the National Institute of Standards and Technology, 101(1), 1996, pp. 69-76
Citation: Crk. Marrian et Rj. Colton, PAPERS FROM THE 3RD INTERNATIONAL-CONFERENCE ON NANOMETER-SCALE SCIENCE AND TECHNOLOGY - 24-28 OCTOBER 1994 COLORADO-CONVENTION-CENTER, DENVER, COLORADO, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1074-1074
Authors:
HARRISON JA
WHITE CT
COLTON RJ
BRENNER DW
Citation: Ja. Harrison et al., INVESTIGATION OF THE ATOMIC-SCALE FRICTION AND ENERGY-DISSIPATION IN DIAMOND USING MOLECULAR-DYNAMICS, Thin solid films, 260(2), 1995, pp. 205-211
Authors:
KOLESKE DD
LEE GU
GANS BI
LEE KP
DILELLA DP
WAHL KJ
BARGER WR
WHITMAN LJ
COLTON RJ
Citation: Dd. Koleske et al., DESIGN AND CALIBRATION OF A SCANNING FORCE MICROSCOPE FOR FRICTION, ADHESION, AND CONTACT POTENTIAL STUDIES, Review of scientific instruments, 66(9), 1995, pp. 4566-4574
Citation: Hm. Pollock et al., ATTRACTIVE FORCES BETWEEN MICRON-SIZED PARTICLES - A PATCH CHARGE MODEL, The Journal of adhesion, 51(1-4), 1995, pp. 71-86
Citation: C. Bai et al., 1993 INTERNATIONAL-CONFERENCE ON SCANNING-TUNNELING-MICROSCOPY - PREFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1439-1439
Citation: Ei. Altman et Rj. Colton, INTERACTION OF C-60 WITH THE AU(111) 23X-ROOT-3 RECONSTRUCTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1906-1909
Citation: Sm. Hues et al., MEASUREMENT OF NANOMECHANICAL PROPERTIES OF METALS USING THE ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2211-2214
Citation: Kj. Tupper et al., SIMULATIONS OF SELF-ASSEMBLED MONOLAYERS UNDER COMPRESSION - EFFECT OF SURFACE ASPERITIES, Langmuir, 10(7), 1994, pp. 2041-2043
Citation: Sb. Sinnott et al., SURFACE PATTERNING BY ATOMICALLY-CONTROLLED CHEMICAL FORCES - MOLECULAR-DYNAMICS SIMULATIONS, Surface science, 316(1-2), 1994, pp. 120001055-120001060
Citation: Ei. Altman et Rj. Colton, GROWTH OF RH ON AU(111) - SURFACE INTERMIXING OF IMMISCIBLE METALS, Surface science, 304(1-2), 1994, pp. 120000400-120000406
Citation: Sm. Hues et al., EFFECT OF PZT AND PMN ACTUATOR HYSTERESIS AND CREEP ON NANOINDENTATION MEASUREMENTS USING FORCE MICROSCOPY, Review of scientific instruments, 65(5), 1994, pp. 1561-1565
Citation: Ei. Altman et Rj. Colton, DETERMINATION OF THE ORIENTATION OF C-60 ADSORBED ON AU(111) AND AG(111), Physical review. B, Condensed matter, 48(24), 1993, pp. 18244-18249