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Results:
1-7
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Results: 7
Authors:
COMIZZOLI RB
CRANE GR
FIORINO ME
FRANKENTHAL RP
KRAUTTER HW
PEINS GA
SICONOLFI DJ
SINCLAIR JD
Citation: Rb. Comizzoli et al., MATERIALS RELIABILITY ISSUES WITH COAXIAL-CABLE SYSTEMS FOR THE INFORMATION SUPERHIGHWAY, Journal of materials research, 12(3), 1997, pp. 857-865
Authors:
OSENBACH JW
EVANOSKY TL
CHAND N
COMIZZOLI RB
KRAUTTER HW
Citation: Jw. Osenbach et al., TEMPERATURE-HUMIDITY-BIAS BEHAVIOR AND ACCELERATION FACTORS FOR NONHERMETIC UNCOOLED INP-BASED LASERS, Journal of lightwave technology, 15(5), 1997, pp. 861-873
Authors:
CHAND N
OSENBACH JW
EVANOSKY TL
COMIZZOLI RB
TSANG WT
Citation: N. Chand et al., HIGH-RELIABILITY 1.3-MU-M INP-BASED UNCOOLED LASERS IN NONHERMETIC PACKAGES, IEEE journal of quantum electronics, 32(9), 1996, pp. 1606-1614
Authors:
OSENBACH JW
COMIZZOLI RB
EVANOSKY TL
CHAND N
Citation: Jw. Osenbach et al., DEGRADATION OF INGAAS P-INP LASERS IN HOT-HUMID AMBIENTS - DETERMINATION OF TEMPERATURE-HUMIDITY-BIAS ACCELERATION FACTORS, IEEE photonics technology letters, 7(11), 1995, pp. 1252-1254
Authors:
COMIZZOLI RB
FRANKENTHAL RP
HANSON KJ
KONSTADINIDIS K
OPILA RL
SAPJETA J
SINCLAIR JD
TAKAHASHI KM
FRANK AL
IBIDUNNI AO
Citation: Rb. Comizzoli et al., ELECTROCHEMICAL ASPECTS OF CORROSION-RESISTANCE AND ETCHING OF METALLIZATIONS FOR MICROELECTRONICS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 198(1-2), 1995, pp. 153-160
Authors:
CHAND N
KOLA RR
OPILA RL
COMIZZOLI RB
KRAUTTER H
SERGENT AM
TSANG WT
OSENBACH JW
LUFTMAN HS
Citation: N. Chand et al., STRESS-FREE AND MOISTURE INSENSITIVE SILICON-OXIDE DIELECTRIC FILMS FORMED BY MOLECULAR-BEAM DEPOSITION, Journal of applied physics, 78(5), 1995, pp. 3315-3322
Authors:
SCHNABLE GL
SCHLESIER KM
WU CP
COMIZZOLI RB
Citation: Gl. Schnable et al., RELIABILITY IMPLICATIONS OF LATERAL ALKALI-ION MIGRATION IN MOS INTEGRATED-CIRCUITS, Journal of the Electrochemical Society, 141(11), 1994, pp. 3250-3253
Risultati:
1-7
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