Citation: S. Richter et al., Bulk changes in semiconductors using scanning probe microscopy: nm-size fabricated structures, PHYS REV B, 59(16), 1999, pp. 10877-10884
Authors:
Lyahovitskaya, V
Richter, S
Frolow, F
Kaplan, L
Manassen, Y
Gartsman, K
Cahen, D
Citation: V. Lyahovitskaya et al., Growth of single CuInSe2 crystals by the traveling heater method and theircharacterization, J CRYST GR, 197(1-2), 1999, pp. 177-185
Authors:
Rau, U
Braunger, D
Herberholz, R
Schock, HW
Guillemoles, JF
Kronik, L
Cahen, D
Citation: U. Rau et al., Oxygenation and air-annealing effects on the electronic properties of Cu(In,Ga)Se-2 films and devices, J APPL PHYS, 86(1), 1999, pp. 497-505
Authors:
Cohen, R
Kronik, L
Shanzer, A
Cahen, D
Liu, A
Rosenwaks, Y
Lorenz, JK
Ellis, AB
Citation: R. Cohen et al., Molecular control over semiconductor surface electronic properties: Dicarboxylic acids on CdTe, CdSe, GaAs, and InP, J AM CHEM S, 121(45), 1999, pp. 10545-10553