AAAAAA
Results:
1-7
|
Results: 7
Authors:
Palau, JM
Hubert, G
Coulie, K
Sagnes, B
Calvet, MC
Fourtine, S
Citation: Jm. Palau et al., Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions, IEEE NUCL S, 48(2), 2001, pp. 225-231
Authors:
Wrobel, F
Palau, JM
Calvet, MC
Bersillon, O
Duarte, H
Citation: F. Wrobel et al., Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions, IEEE NUCL S, 47(6), 2000, pp. 2580-2585
Authors:
Hubert, G
Palau, JM
Roche, P
Sagnes, B
Gasiot, J
Calvet, MC
Citation: G. Hubert et al., Study of basic mechanisms induced by an ionizing particle on simple structures, IEEE NUCL S, 47(3), 2000, pp. 519-526
Authors:
Pouget, V
Lewis, D
Lapuyade, H
Briand, R
Fouillat, P
Sarger, L
Calvet, MC
Citation: V. Pouget et al., Validation of radiation hardened designs by pulsed laser testing and SPICEanalysis, MICROEL REL, 39(6-7), 1999, pp. 931-935
Authors:
Lorfevre, E
Sagnes, B
Bruguier, G
Palau, JM
Gasiot, J
Calvet, MC
Ecoffet, R
Citation: E. Lorfevre et al., Cell design modifications to harden a N-channel power IGBT against Single Event Latchup, IEEE NUCL S, 46(6), 1999, pp. 1410-1414
Authors:
Cazenave, P
Fouillat, P
Montagner, X
Barnaby, H
Schrimpf, RD
Bonora, L
David, JP
Touboul, A
Calvet, MC
Calvel, P
Citation: P. Cazenave et al., Total dose effects on gate controlled lateral PNP bipolar junction transistors, IEEE NUCL S, 45(6), 1998, pp. 2577-2583
Authors:
Vial, C
Palau, JM
Gasiot, J
Calvet, MC
Fourtine, S
Citation: C. Vial et al., A new approach for the prediction of the neutron-induced SEU rate, IEEE NUCL S, 45(6), 1998, pp. 2915-2920
Risultati:
1-7
|