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Results: 1-25 | 26-28
Results: 1-25/28
Optimization of the silicon sensors for the CMS tracker
Authors: Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Biino, C Bilei, GM Bisello, D Boemi, D Bosi, F Borello, L Braibant, S Breuker, H Brunetti, MT Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Costa, M Creanza, D D'Alessandro, R DeMaria, N de Palma, M Dell'Orso, R Dutta, S Favro, G Fiore, L Focardi, E French, M Freudenreich, K Frey, A Friedl, M Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, W Gu, WH Hall, G Hammarstrom, R Hebbeker, T Honkanen, A Honma, A Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A Migliore, E My, S Neviani, A Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pernicka, M Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Rizzo, F Santocchia, A Segneri, G Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Starodumov, A Stavitski, I Surrow, B Tempesta, P Tonelli, G Tricomi, A Tuominiemi, J Tuuva, T Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: S. Albergo et al., Optimization of the silicon sensors for the CMS tracker, NUCL INST A, 466(2), 2001, pp. 300-307
Improvement in breakdown characteristics with multiguard structures in microstrip silicon detectors for CMS
Authors: Bacchetta, N Bisello, D Candelori, A Da Rold, M Descovich, M Kaminski, A Messineo, A Rizzo, F Verzellesi, G
Citation: N. Bacchetta et al., Improvement in breakdown characteristics with multiguard structures in microstrip silicon detectors for CMS, NUCL INST A, 461(1-3), 2001, pp. 204-206
Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons
Authors: Wyss, J Bisello, D Candelori, A Kaminsky, A Pantano, D
Citation: J. Wyss et al., Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons, NUCL INST A, 457(3), 2001, pp. 595-600
High energy Si ion irradiation effects on 10 nm thick oxide MOS capacitors
Authors: Candelori, A Paccagnella, A Raggi, G Wyss, J Bisello, D Ghidini, G
Citation: A. Candelori et al., High energy Si ion irradiation effects on 10 nm thick oxide MOS capacitors, J NON-CRYST, 280(1-3), 2001, pp. 193-201
Thin oxide degradation after high-energy ion irradiation
Authors: Candelori, A Ceschia, M Paccagnella, A Wyss, J Bisello, D Ghidini, G
Citation: A. Candelori et al., Thin oxide degradation after high-energy ion irradiation, IEEE NUCL S, 48(5), 2001, pp. 1735-1743
Radiation damage of standard and oxygenated silicon diodes irradiated by 16-MeV and 27-MeV protons
Authors: Bisello, D Wyss, J Candelori, A Kaminsky, A Pantano, D
Citation: D. Bisello et al., Radiation damage of standard and oxygenated silicon diodes irradiated by 16-MeV and 27-MeV protons, IEEE NUCL S, 48(4), 2001, pp. 1020-1027
The CMS silicon tracker
Authors: Focardi, E Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Feld, L Fiore, L French, M Freudenreich, K Frey, A Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammarstrom, R Hebbeker, T Honma, A Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Leubelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G McEvoy, B Meschini, M Messineo, A Migliore, E My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Rizzo, F Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Starodumov, A Stavitski, I Stefanini, G Surrow, B Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: E. Focardi et al., The CMS silicon tracker, NUCL INST A, 453(1-2), 2000, pp. 121-125
Performance of CMS silicon microstrip detectors with the APV6 readout chip
Authors: Meschini, M Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: M. Meschini et al., Performance of CMS silicon microstrip detectors with the APV6 readout chip, NUCL INST A, 447(1-2), 2000, pp. 133-141
New results on silicon microstrip detectors of CMS tracker
Authors: Demaria, N Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bolla, G Bosi, F Borrello, L Bortoletto, D Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Favro, G Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A Migliore, E My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: N. Demaria et al., New results on silicon microstrip detectors of CMS tracker, NUCL INST A, 447(1-2), 2000, pp. 142-150
Heavy ion irradiation of thin gate oxides
Authors: Ceschia, M Paccagnella, A Turrini, M Candelori, A Ghidini, G Wyss, J
Citation: M. Ceschia et al., Heavy ion irradiation of thin gate oxides, IEEE NUCL S, 47(6), 2000, pp. 2648-2655
Test results on heavily irradiated silicon detectors for the CMS experiment at LHC
Authors: Bozzi, C Albergo, S Angarano, MM Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Braibant, S Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Rizzo, F Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: C. Bozzi et al., Test results on heavily irradiated silicon detectors for the CMS experiment at LHC, IEEE NUCL S, 47(6), 2000, pp. 2092-2100
SPICE evaluation of the S/N ratio for Si microstrip detectors
Authors: Candelori, A Paccagnella, A Nardi, F Bacchetta, N Bisello, D
Citation: A. Candelori et al., SPICE evaluation of the S/N ratio for Si microstrip detectors, NUOV CIM A, 112(1-2), 1999, pp. 75-85
Breakdown of coupling dielectrics for Si microstrip detectors
Authors: Candelori, A Paccagnella, A Saglimbeni, G Bisello, D
Citation: A. Candelori et al., Breakdown of coupling dielectrics for Si microstrip detectors, NUOV CIM A, 112(1-2), 1999, pp. 87-93
Comparative study of < 111 > and < 100 > crystals and capacitance measurements on Si strip detectors in CMS
Authors: Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A Migliore, E My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: S. Albergo et al., Comparative study of < 111 > and < 100 > crystals and capacitance measurements on Si strip detectors in CMS, NUOV CIM A, 112(11), 1999, pp. 1261-1269
High-voltage breakdown studies on Si microstrip detectors
Authors: Albergo, S Angarano, MM Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Calefato, G Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: S. Albergo et al., High-voltage breakdown studies on Si microstrip detectors, NUOV CIM A, 112(11), 1999, pp. 1271-1283
The silicon microstrip tracker for CMS
Authors: Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Buffini, A Busoni, S Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Plama, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Feld, L Fiore, L Focardi, E French, M Freudenreich, K Frey, A Furtjes, A Giassi, A Giorgi, M Giraldo, A Glessing, B Gu, WH Hall, G Hammarstrom, R Hebbeker, T Honma, A Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A Migliore, E My, S Paccagnella, A Palla, F Pandoulas, D Papi, A Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Radicci, V Raffaelli, F Raymond, M Rizzo, F Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Starodumov, A Stavitski, I Stefanini, G Surrow, B Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Li, YH Watts, S Wittmer, B
Citation: S. Albergo et al., The silicon microstrip tracker for CMS, NUOV CIM A, 112(11), 1999, pp. 1307-1316
The silicon microstrip tracker for CMS
Authors: Pandoulas, D Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Borrello, L Bosi, F Bozzi, C Braibant, S Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N De Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliot-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giraldo, A Glessing, WD Gu, WH Hall, G Hammarstrom, R Hebbeker, T Honkanen, A Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Kellogg, R Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A My, S Paccagnella, S Palla, F Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitsky, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Wang, Y Watts, S Wittmer, B Xie, Z
Citation: D. Pandoulas et al., The silicon microstrip tracker for CMS, NUCL PH B-P, 78, 1999, pp. 315-321
R&D for the CMS silicon tracker
Authors: Feld, L Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Barr, A Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giraldo, A Glessing, WD Gu, WH Hall, G Hammarstrom, R Hebbeker, T Honkanen, A Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Kellogg, R Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G Mc Evoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: L. Feld et al., R&D for the CMS silicon tracker, NUCL PH B-P, 78, 1999, pp. 322-328
The CMS silicon strip tracker
Authors: Focardi, E Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L French, M Freudenreich, K Furtjes, A Giassi, A Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G McEvoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Santocchia, A Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: E. Focardi et al., The CMS silicon strip tracker, NUCL INST A, 435(1-2), 1999, pp. 102-108
The R&D program for silicon detectors in CMS
Authors: Tonelli, G Albergo, S Angarano, M Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Braibant, S Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Creanza, D D'Alessandro, R Da Rold, M Demaria, N de Palma, M Dell'Orso, R Della Marina, R Dutta, S Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Furtjes, A Giassi, A Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hebbeker, T Hrubec, J Huhtinen, M Kaminsky, A Karimaki, V Koenig, S Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Mattig, P Maggi, G Mannelli, M Mantovani, G Marchioro, A Mariotti, C Martignon, G McEvoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: G. Tonelli et al., The R&D program for silicon detectors in CMS, NUCL INST A, 435(1-2), 1999, pp. 109-117
The CMS silicon microstrip detectors: research and development
Authors: Bacchetta, N Albergo, S Azzi, P Babucci, E Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Connotte, J Creanza, D D'Alessandro, R Da Rold, M de Palma, M Dell'Orso, R Della Marina, R Eklund, C Elliott-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Giassi, A Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hrubec, J Huhtinen, M Karimaki, V Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Maggi, G Mannelli, M Mantovani, G Marchioro, A Martignon, G Mc Evoy, B Meschini, M Messineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: N. Bacchetta et al., The CMS silicon microstrip detectors: research and development, NUCL INST A, 426(1), 1999, pp. 16-23
Test results of heavily irradiated Si detectors
Authors: Albergo, S Azzi, P Babucci, E Bacchetta, N Bader, A Bagliesi, G Bartalini, P Basti, A Biggeri, U Bilei, GM Bisello, D Boemi, D Bosi, F Borrello, L Bozzi, C Breuker, H Bruzzi, M Candelori, A Caner, A Castaldi, R Castro, A Catacchini, E Checcucci, B Ciampolini, P Civinini, C Connotte, J Creanza, D D'Alessandro, R Da Rold, M de Palma, M Dell'Orso, R Della Marina, R Eklund, D Elliot-Peisert, A Feld, L Fiore, L Focardi, E French, M Freudenreich, K Giassi, A Giraldo, A Glessing, B Gu, WH Hall, G Hammerstrom, R Hrubec, J Huhtinen, M Karimaki, V Krammer, M Lariccia, P Lenzi, M Loreti, M Luebelsmeyer, K Lustermann, W Maggi, D Mannelli, M Mantovani, G Marchioro, A Martignon, G Mc Evoy, B Meschini, M Mesineo, A My, S Paccagnella, A Palla, F Pandoulas, D Parrini, G Passeri, D Pieri, M Piperov, S Potenza, R Raffaelli, F Raso, G Raymond, M Schmitt, B Selvaggi, G Servoli, L Sguazzoni, G Siedling, R Silvestris, L Skog, K Starodumov, A Stavitski, I Stefanini, G Tempesta, P Tonelli, G Tricomi, A Tuuva, T Vannini, C Verdini, PG Viertel, G Xie, Z Wang, Y Watts, S Wittmer, B
Citation: S. Albergo et al., Test results of heavily irradiated Si detectors, NUCL INST A, 422(1-3), 1999, pp. 238-241
Degradation of electron irradiated MOS capacitors
Authors: Candelori, A Paccagnella, A Scarpa, A Ghidini, G Fuochi, PG
Citation: A. Candelori et al., Degradation of electron irradiated MOS capacitors, MICROEL REL, 39(2), 1999, pp. 227-233
Low-field current on thin oxides after constant current or radiation stresses
Authors: Ceschia, M Paccagnella, A Cester, A Scarpa, A Candelori, A Ghidini, G
Citation: M. Ceschia et al., Low-field current on thin oxides after constant current or radiation stresses, J NON-CRYST, 245, 1999, pp. 232-237
Electron irradiation effects on thin MOS capacitors
Authors: Candelori, A Paccagnella, A Cammarata, M Ghidini, G Ceschia, M
Citation: A. Candelori et al., Electron irradiation effects on thin MOS capacitors, J NON-CRYST, 245, 1999, pp. 238-244
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