Authors:
Hardikar, S
Xu, YZ
Cao, GJ
De Souza, MM
Narayanan, EMS
Citation: S. Hardikar et al., An investigation into the mechanisms limiting the safe operating area of aLIGBT in DI and DELDI technologies, MICROELEC J, 32(2), 2001, pp. 121-126
Citation: Gj. Cao et al., Trade-off between the Kirk effect and the breakdown performance in resurfed lateral bipolar transistors for high voltage, high frequency applications, SOL ST ELEC, 44(10), 2000, pp. 1869-1873