Authors: Mastrapasqua, M Esseni, D Celler, GK Fiegna, C Selmi, L Sangiorgi, E

Citation: M. Mastrapasqua et al., Measurements of low field mobility in ultra-thin SOI n- and p-MOSFETs, MICROEL ENG, 59(1-4), 2001, pp. 409-416

Authors: Celler, GK Barr, DL Rosamilia, JM

Citation: Gk. Celler et al., Etching of silicon by the RCA Standard Clean 1, EL SOLID ST, 3(1), 2000, pp. 47-49

Authors: Vuong, HH Gossmann, HJ Pelaz, L Celler, GK Jacobson, DC Barr, D Hergenrother, J Monroe, D Venezia, VC Rafferty, CS Hillenius, SJ McKinley, J Stevie, FA Granger, C

Citation: Hh. Vuong et al., Boron pileup and clustering in silicon-on-insulator films, APPL PHYS L, 75(8), 1999, pp. 1083-1085