Authors:
Olivier, M
Rochat, N
Chabli, A
Lefeuvre, G
Conne, F
Citation: M. Olivier et al., Multiple internal reflection spectroscopy: a sensitive non-destructive probe for interfaces and nanometric layers, MAT SC S PR, 4(1-3), 2001, pp. 15-18
Authors:
Borsoni, G
Le Roux, V
Laffitte, R
Kerdiles, S
Bechu, N
Vallier, L
Korwin-Pawlowski, ML
Vannuffel, C
Bertin, F
Vergnaud, C
Chabli, A
Wyon, C
Citation: G. Borsoni et al., Dependence of ultra-thin SiO2 layers formation by ultra-slow single and multicharged ions on process conditions, MICROEL ENG, 59(1-4), 2001, pp. 311-315
Authors:
Ermolieff, A
Chabli, A
Pierre, F
Rolland, G
Rouchon, D
Vannuffel, C
Vergnaud, C
Baylet, J
Semeria, MN
Citation: A. Ermolieff et al., XPS, Raman spectroscopy, X-ray diffraction, specular X-ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization, SURF INT AN, 31(3), 2001, pp. 185-190
Authors:
Chabli, A
Guitton, D
Fortin, S
Molotchnikoff, S
Citation: A. Chabli et al., Cross-correlated and oscillatory visual responses of superficial-layer andtecto-reticular neurones in cat superior colliculus, EXP BRAIN R, 131(1), 2000, pp. 44-56
Authors:
Rochat, N
Olivier, M
Chabli, A
Conne, F
Lefeuvre, G
Boll-Burdet, C
Citation: N. Rochat et al., Multiple internal reflection infrared spectroscopy using two-prism coupling geometry: A convenient way for quantitative study of organic contamination on silicon wafers, APPL PHYS L, 77(14), 2000, pp. 2249-2251
Authors:
Olivier, M
Martin, F
Chabli, A
Lefeuvre, G
Conne, F
Rochat, N
Citation: M. Olivier et al., Infrared study of hydrogen in ultra-thin silicon nitride films using multiple internal reflection spectroscopy (MIR) in 200 mm silicon wafers, PHYS ST S-A, 175(1), 1999, pp. 137-143
Authors:
Bertin, F
Baron, T
Mariolle, D
Martin, F
Chabli, A
Dupuy, M
Citation: F. Bertin et al., Characterization of deposited nanocrystalline silicon by spectroscopic ellipsometry, PHYS ST S-A, 175(1), 1999, pp. 405-412
Authors:
Chabli, A
Fortin, S
Shumikhina, S
Molotchnikoff, S
Citation: A. Chabli et al., Response component analysis of simple and complex cells of area 18 during depression of area 17, CAN J PHYSL, 77(3), 1999, pp. 175-181
Authors:
Mechin, L
Chabli, A
Bertin, F
Burdin, M
Rolland, G
Vannuffel, C
Villegier, JC
Citation: L. Mechin et al., A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates, J APPL PHYS, 84(9), 1998, pp. 4935-4940