Authors: Martinez, O Jimenez, J Chambonnet, D Belouet, C

Citation: O. Martinez et al., Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films, J MATER RES, 15(5), 2000, pp. 1069-1075

Authors: Chambonnet, D

Citation: D. Chambonnet, Deposition of thin films by laser ablation: procedure confined to a few industrial niches?, J PHYS IV, 9(P5), 1999, pp. 125-130

Authors: Legrand, C Haccart, T Velu, G Chambonnet, D Remiens, D Burgnies, L Mehri, F Carru, JC

Citation: C. Legrand et al., Dielectric characterization of ferroelectric thin films deposited on silicon, MICROEL REL, 39(2), 1999, pp. 251-256

Authors: Chambonnet, D Audry, C Fages-Bonnery, A Mer, C Fages, C Perriere, J

Citation: D. Chambonnet et al., Growth of BST thin films on silicon substrates. Application to integrated capacitors for DC-DC converters, J PHYS IV, 8(P9), 1998, pp. 213-216