Authors:
Chantler, CT
Tran, CQ
Barnea, Z
Paterson, D
Cookson, DJ
Balaic, DX
Citation: Ct. Chantler et al., Measurement of the x-ray mass attenuation coefficient of copper using 8.85-20 keV synchrotron radiation - art. no. 062506, PHYS REV A, 6406(6), 2001, pp. 2506
Citation: Ct. Chantler, New theoretical investigation resolving discrepancies of atomic form factors and attenuation coefficients in the near-edge soft X-ray regime, RADIAT PH C, 61(3-6), 2001, pp. 343-345
Authors:
Chantler, CT
Tran, CQ
Paterson, D
Barnea, Z
Cookson, DJ
Citation: Ct. Chantler et al., Direct observation of scattering contributions in X-ray attenuation measurements, and evidence for Rayleigh scattering from copper samples rather than thermal-diffuse or Bragg-Laue scattering, RADIAT PH C, 61(3-6), 2001, pp. 347-350
Citation: Ct. Chantler, Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z=30-36, Z=60-89, E=0.1-10 keV) - addressing convergence issues of earlier work, J SYNCHROTR, 8, 2001, pp. 1124-1124
Authors:
Chantler, CT
Tran, CQ
Paterson, D
Cookson, D
Barnea, Z
Citation: Ct. Chantler et al., X-ray extended-range technique for precision measurement of the X-ray massattenuation coefficient and Im(f) for copper using synchrotron radiation, PHYS LETT A, 286(5), 2001, pp. 338-346
Authors:
Chantler, CT
Paterson, D
Hudson, LT
Serpa, FG
Gillaspy, JD
Takacs, E
Citation: Ct. Chantler et al., Absolute measurement of the resonance lines in heliumlike vanadium on an electron-beam ion trap - art. no. 042501, PHYS REV A, 6204(4), 2000, pp. 2501
Authors:
Chantler, CT
Tran, CQ
Paterson, D
Barnea, Z
Cookson, DJ
Citation: Ct. Chantler et al., Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 1. modelling, data collection, and deduction of simple measures of association, X-RAY SPECT, 29(6), 2000, pp. 449-458
Authors:
Chantler, CT
Tran, CQ
Paterson, D
Cookson, DJ
Barnea, Z
Citation: Ct. Chantler et al., Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 2. isolation of component noise sources, and application to attenuationmeasurements showing increased precision by two orders of magnitude, X-RAY SPECT, 29(6), 2000, pp. 459-466
Citation: Ct. Chantler, Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z=30-36, Z=60-89, E=0.1 keV-10 keV),addressing convergence issues of earlier work, J PHYS CH R, 29(4), 2000, pp. 597-1048
Citation: Ct. Chantler, Resolution of discrepancies of atomic form factors and attenuation coefficients in the near-edge soft X-ray regime, RADIAT PH C, 55(3), 1999, pp. 231-237
Citation: Ct. Chantler et Z. Barnea, Resolution of a discrepancy of x-ray attenuation measurements of silicon in the energy range 25-50 keV, J PHYS-COND, 11(20), 1999, pp. 4087-4091
Authors:
Chantler, CT
Barnea, Z
Tran, CQ
Tiller, JB
Paterson, D
Citation: Ct. Chantler et al., Precision X-ray optics for fundamental interactions in atomic physics, resolving discrepancies in the X-ray regime, OPT QUANT E, 31(5), 1999, pp. 495-505
Authors:
Chantler, CT
Paterson, D
Hudson, LT
Serpa, FG
Gillaspy, JD
Takacs, E
Citation: Ct. Chantler et al., Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error, PHYS SCR, T80B, 1999, pp. 440-442