Authors: Mir, S Parrain, F Charlot, B Veychard, D

Citation: S. Mir et al., Microbeams with electronically controlled high thermal impedance, ANALOG IN C, 29(1-2), 2001, pp. 71-83

Authors: Charlot, B Mir, S Parrain, F Courtois, B

Citation: B. Charlot et al., Generation of electrically induced stimuli for MEMS self-test, J ELEC TEST, 17(6), 2001, pp. 459-470

Authors: Mir, S Charlot, B Courtois, B

Citation: S. Mir et al., Extending fault-based testing to microelectromechanical systems, J ELEC TEST, 16(3), 2000, pp. 279-288

Authors: Mir, S Charlot, B

Citation: S. Mir et B. Charlot, On the integration of design and test for chips embedding MEMS, IEEE DES T, 16(4), 1999, pp. 28-38