Authors:
Gomes, S
Trannoy, N
Grossel, P
Depasse, F
Bainier, C
Charraut, D
Citation: S. Gomes et al., DC scanning thermal microscopy: Characterisation and interpretation of themeasurement, INT J TH SC, 40(11), 2001, pp. 949-958
Authors:
Spajer, M
Parent, G
Bainier, C
Charraut, D
Citation: M. Spajer et al., Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beam, J MICROSC O, 202, 2001, pp. 45-49