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Results:
1-9
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Results: 9
Authors:
Fleet, E
Gilbertson, A
Chatraphorn, S
Tralshawala, N
Weinstock, H
Wellstood, FC
Citation: E. Fleet et al., Imaging defects in Cu-clad NbTi wire using a high-T-c scanning SQUID microscope, IEEE APPL S, 11(1), 2001, pp. 215-218
Authors:
Chatraphorn, S
Fleet, EF
Wellstood, FC
Knauss, LA
Citation: S. Chatraphorn et al., Noise and spatial resolution in SQUID microscopy, IEEE APPL S, 11(1), 2001, pp. 234-237
Authors:
Fleet, EF
Chatraphorn, S
Wellstood, FC
Eylem, C
Citation: Ef. Fleet et al., Determination of magnetic properties using a room-temperature scanning SQUID microscope, IEEE APPL S, 11(1), 2001, pp. 1180-1183
Authors:
Fleet, EF
Chatraphorn, S
Wellstood, FC
Knauss, LA
Green, SM
Citation: Ef. Fleet et al., Closed-cycle refrigerator-cooled scanning SQUID microscope for room-temperature samples, REV SCI INS, 72(8), 2001, pp. 3281-3290
Authors:
Knauss, LA
Cawthorne, AB
Lettsome, N
Kelly, S
Chatraphorn, S
Fleet, EF
Wellstood, FC
Vanderlinde, WE
Citation: La. Knauss et al., Scanning SQUID microscopy for current imaging, MICROEL REL, 41(8), 2001, pp. 1211-1229
Authors:
Chatraphorn, S
Fleet, EF
Wellstood, FC
Knauss, LA
Eiles, TM
Citation: S. Chatraphorn et al., Scanning SQUID microscopy of integrated circuits, APPL PHYS L, 76(16), 2000, pp. 2304-2306
Authors:
Fleet, EF
Chatraphorn, S
Wellstood, FC
Green, SM
Knauss, LA
Citation: Ef. Fleet et al., HTS scanning SQUID microscope cooled by a closed-cycle refrigerator, IEEE APPL S, 9(2), 1999, pp. 3704-3707
Authors:
Fleet, EF
Chatraphorn, S
Wellstood, FC
Knauss, LA
Citation: Ef. Fleet et al., HTS scanning SQUID microscopy of active circuits, IEEE APPL S, 9(2), 1999, pp. 4103-4106
Authors:
Chatraphorn, S
Fleet, EF
Wellstood, FC
Black, RC
Citation: S. Chatraphorn et al., Imaging high-frequency magnetic and electric fields using a high-T-c SQUIDmicroscope, IEEE APPL S, 9(2), 1999, pp. 4381-4384
Risultati:
1-9
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