Authors:
Nikiforov, AI
Cherepanov, VA
Pchelyakov, OP
Citation: Ai. Nikiforov et al., Investigation of Ge film growth on the Si(100) surface by recording diffractometry, SEMICONDUCT, 35(9), 2001, pp. 988-991
Authors:
Voronin, VI
Berger, IF
Cherepanov, VA
Gavrilova, LY
Petrov, AN
Ancharov, AI
Tolochko, BP
Nikitenko, SG
Citation: Vi. Voronin et al., Neutron diffraction, synchrotron radiation and EXAFS spectroscopy study ofcrystal structure peculiarities of the lanthanum nickelates Lan+1NinOy (n=1,2,3), NUCL INST A, 470(1-2), 2001, pp. 202-209
Authors:
Markov, VA
Cheng, HH
Chia, CT
Nikiforov, AI
Cherepanov, VA
Pchelyakov, OP
Zhuravlev, KS
Talochkin, AB
McGlynn, E
Henry, MO
Citation: Va. Markov et al., RHEED studies of nucleation of Ge islands on Si(001) and optical properties of ultra-small Ge quantum dots, THIN SOL FI, 369(1-2), 2000, pp. 79-83
Authors:
Filonova, EA
Cherepanov, VA
Zaitseva, NA
Voronin, VI
Citation: Ea. Filonova et al., Phase equilibria and the crystal structure of phases in the MeCo1-xMnxO3-delta (Me = Sr, Ba) systems, ZH FIZ KHIM, 73(5), 1999, pp. 862-866
Citation: Ea. Filonova et al., A study of the phase composition and crystal structure in the series of LaCo1-xMnxO3 +/-delta solid solutions, ZH FIZ KHIM, 72(10), 1998, pp. 1876-1878
Authors:
Nikiforov, AI
Markov, VA
Cherepanov, VA
Pchelyakov, OP
Citation: Ai. Nikiforov et al., The influence of growth temperature on the period of RHEED oscillations during MBE of Si and Ge on Si(111) surface, THIN SOL FI, 336(1-2), 1998, pp. 183-187