Authors: Chertouk, M Dammann, M Kohler, K Weimann, G

Citation: M. Chertouk et al., 0.15 mu m passivated InP-based HEMT's MMIC technology with high thermal stability in hydrogen ambient, IEEE ELEC D, 21(3), 2000, pp. 97-99

Authors: Dammann, M Chertouk, M Jantz, W Kohler, K Weimann, G

Citation: M. Dammann et al., Reliability of InAlAs/InGaAs HEMTs grown on GaAs substrate with metamorphic buffer, MICROEL REL, 40(8-10), 2000, pp. 1709-1713

Authors: Dammann, M Chertouk, M Jantz, W Kohler, K Marsetz, W Schmidt, KH Weimann, G

Citation: M. Dammann et al., Effect of drain voltage on channel temperature and reliability of pseudomorphic InP-based HEMTs, MICROEL REL, 40(2), 2000, pp. 287-291