Authors: Ciampolini, L Giannazzo, F Ciappa, M Fichtner, W Raineri, V

Citation: L. Ciampolini et al., Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n(+)-p samples, MAT SC S PR, 4(1-3), 2001, pp. 85-88

Authors: Giannazzo, F Calcagno, L Raineri, V Ciampolini, L Ciappa, M Napolitani, E

Citation: F. Giannazzo et al., Quantitative carrier profiling in ion-implanted 6H-SiC, APPL PHYS L, 79(8), 2001, pp. 1211-1213

Authors: Malberti, P Ciampolini, L Ciappa, M Fichtner, W

Citation: P. Malberti et al., Quantification of scanning capacitance microscopy measurements for 2D dopant profiling, MICROEL REL, 40(8-10), 2000, pp. 1395-1399

Authors: Ciampolini, L Ciappa, M Malberti, P Regli, P Fichtner, W

Citation: L. Ciampolini et al., Modelling thermal effects of large contiguous voids in solder joints, MICROELEC J, 30(11), 1999, pp. 1115-1123

Authors: Catacchini, E Ciampolini, L Civinini, C D'Alessandro, R Focardi, E Lenzi, M Meschini, M Parrini, G Pieri, M

Citation: E. Catacchini et al., Design, characterization and beam test performance of different silicon microstrip detector geometries, NUCL INST A, 419(2-3), 1998, pp. 544-548