Authors:
Lezzi, AM
Beretta, GP
Comini, E
Faglia, G
Galli, G
Sberveglieri, G
Citation: Am. Lezzi et al., Influence of gaseous species transport on the response of solid state gas sensors within enclosures, SENS ACTU-B, 78(1-3), 2001, pp. 144-150
Authors:
Pardo, M
Niederjaufner, G
Benussi, G
Comini, E
Faglia, G
Sberveglieri, G
Holmberg, M
Lundstrom, I
Citation: M. Pardo et al., Data preprocessing enhances the classification of different brands of Espresso coffee with an electronic nose, SENS ACTU-B, 69(3), 2000, pp. 397-403
Authors:
Comini, E
Faglia, G
Sberveglieri, G
Cantalini, C
Passacantando, M
Santucci, S
Li, Y
Wlodarski, W
Qu, W
Citation: E. Comini et al., Carbon monoxide response of molybdenum oxide thin films deposited by different techniques, SENS ACTU-B, 68(1-3), 2000, pp. 168-174
Authors:
Dieguez, A
Romano-Rodriguez, A
Morante, JR
Sangaletti, L
Depero, LE
Comini, E
Faglia, G
Sberveglieri, G
Citation: A. Dieguez et al., Influence of the completion of oxidation on the long-term response of RGTOSnO2 gas sensors, SENS ACTU-B, 66(1-3), 2000, pp. 40-42
Authors:
Comini, E
Faglia, G
Sberveglieri, G
Li, YX
Wlodarski, W
Ghantasala, MK
Citation: E. Comini et al., Sensitivity enhancement towards ethanol and methanol of TiO2 films doped with Pt and Nb, SENS ACTU-B, 64(1-3), 2000, pp. 169-174
Authors:
Cantalini, C
Wlodarski, W
Li, Y
Passacantando, M
Santucci, S
Comini, E
Faglia, G
Sberveglieri, G
Citation: C. Cantalini et al., Investigation on the O-3 sensitivity properties of WO3 thin films preparedby sol-gel, thermal evaporation and r.f. sputtering techniques, SENS ACTU-B, 64(1-3), 2000, pp. 182-188
Authors:
Boarino, L
Rocchia, M
Baratto, C
Rossi, AM
Garrone, E
Borini, S
Geobaldo, F
Comini, E
Faglia, G
Sberveglieri, G
Amato, G
Citation: L. Boarino et al., Towards a deeper comprehension of the interaction mechanisms between mesoporous silicon and NO2, PHYS ST S-A, 182(1), 2000, pp. 465-471
Authors:
Ferroni, M
Guidi, V
Martinelli, G
Comini, E
Sberveglieri, G
Boscarino, D
Della Mea, G
Citation: M. Ferroni et al., Electron microscopy and Rutherford backscattering study of nucleation and growth in nanosized W-Ti-O thin films, J APPL PHYS, 88(2), 2000, pp. 1097-1103