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Results: 1-4 |
Results: 4

Authors: Conley, W Dean, K Miller, D Rich, G Graffenberg, V Patel, S Lin, SH Jamieson, A Hung, R Yamada, S Pinnow, M MacDonald, S Chambers, C Osborne, B Patterson, K Somervell, M Trinque, B Tran, HV Cho, S Chiba, T Byers, J Tomas, B Shafer, G DesMarteau, D Klopp, J Frechet, J Sanders, D Grubbs, R Ober, C Korner, H Willson, CG
Citation: W. Conley et al., Developments in materials for 157nm photoresists, SOL ST TECH, 44(10), 2001, pp. 63

Authors: Brodsky, C Byers, J Conley, W Hung, R Yamada, S Patterson, K Somervell, M Trinque, B Tran, HV Cho, S Chiba, T Lin, SH Jamieson, A Johnson, H Vander Heyden, T Willson, CG
Citation: C. Brodsky et al., 157 nm resist materials: Progress report, J VAC SCI B, 18(6), 2000, pp. 3396-3401

Authors: Zhang, F de Beeck, MO Schaekers, M Ronse, K Conley, W Gopalan, P Gangala, H Dusa, M Bendik, J
Citation: F. Zhang et al., CD control using SiONBARL processing for sub-0.25 mu m lithography, MICROEL ENG, 46(1-4), 1999, pp. 51-54

Authors: Farrar, N Conley, W Gangala, H Babcock, C Liu, HY
Citation: N. Farrar et al., Can we do 0.15 mu m lithography with KrF?, MICROEL ENG, 46(1-4), 1999, pp. 97-100
Risultati: 1-4 |