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Results:
1-4
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Results: 4
Silicon p-n junctions biased above breakdown used as monitors of carrier lifetime
Authors:
Sciacca, E Lombardo, S Patti, D Ghioni, M Zappa, F Rimini, E Cova, S
Citation:
E. Sciacca et al., Silicon p-n junctions biased above breakdown used as monitors of carrier lifetime, MAT SC S PR, 4(1-3), 2001, pp. 159-161
Tools for contactless testing and simulation of CMOS circuits
Authors:
Stellari, F Zappa, F Cova, S Vendrame, L
Citation:
F. Stellari et al., Tools for contactless testing and simulation of CMOS circuits, MICROEL REL, 41(11), 2001, pp. 1801-1808
Laser-based distance measurement using picosecond resolution time-correlated single-photon counting
Authors:
Pellegrini, S Buller, GS Smith, JM Wallace, AM Cova, S
Citation:
S. Pellegrini et al., Laser-based distance measurement using picosecond resolution time-correlated single-photon counting, MEAS SCI T, 11(6), 2000, pp. 712-716
An integrated active-quenching circuit for single-photon avalanche diodes
Authors:
Zappa, F Ghioni, M Cova, S Samori, C Giudice, AC
Citation:
F. Zappa et al., An integrated active-quenching circuit for single-photon avalanche diodes, IEEE INSTR, 49(6), 2000, pp. 1167-1175
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