Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
Single event burnout sensitivity of embedded field effect transistors
Authors:
Koga, R Crain, SH Crawford, KB Yu, P Gordon, MJ
Citation:
R. Koga et al., Single event burnout sensitivity of embedded field effect transistors, IEEE NUCL S, 46(6), 1999, pp. 1395-1402
Comparative SEU sensitivities to relativistic heavy ions
Authors:
Koga, R Crain, SH Crain, WR Crawford, KB Hansel, SJ
Citation:
R. Koga et al., Comparative SEU sensitivities to relativistic heavy ions, IEEE NUCL S, 45(6), 1998, pp. 2475-2482
Risultati:
1-2
|