Authors: Koga, R Crain, SH Crawford, KB Yu, P Gordon, MJ

Citation: R. Koga et al., Single event burnout sensitivity of embedded field effect transistors, IEEE NUCL S, 46(6), 1999, pp. 1395-1402

Authors: Koga, R Crain, SH Crain, WR Crawford, KB Hansel, SJ

Citation: R. Koga et al., Comparative SEU sensitivities to relativistic heavy ions, IEEE NUCL S, 45(6), 1998, pp. 2475-2482