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Results:
1-10
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Results: 10
Authors:
Cremona, M
Citation: M. Cremona, Rhetoric and reticence: EU external commercial policy in a multilateral context, COM MKT L R, 38(2), 2001, pp. 359-396
Authors:
Cremona, M
Gazola, LM
do Carmo, LCS
Castro, JTP
Achete, CA
Citation: M. Cremona et al., In situ hard coatings strain measurement using a commercial strain-gage device, THIN SOL FI, 377, 2000, pp. 436-440
Authors:
Fornarini, L
Martelli, S
Montereali, RM
Righini, GC
Pelli, S
Cremona, M
Citation: L. Fornarini et al., Realisation and characterisation of LiF/NaF thin film planar waveguides, THIN SOL FI, 358(1-2), 2000, pp. 191-195
Authors:
Cremona, M
Mauricio, MHP
Do Carmo, LCS
Prioli, R
Nunes, VB
Zanette, SI
Caride, AO
Albuquerque, MP
Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267
Authors:
Cremona, M
Pereira, JAM
Mauricio, MHP
Do Carmo, LCS
Somma, F
Citation: M. Cremona et al., Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment, RADIAT EFF, 149(1-4), 1999, pp. 215-219
Authors:
Baldacchini, G
Cremona, M
Montereali, RM
Bottazzi, R
Scacco, A
Grassano, UM
Citation: G. Baldacchini et al., Extrinsic aggregated colour centres in Kf : Na+, RADIAT EFF, 149(1-4), 1999, pp. 263-267
Authors:
Baldacchini, G
Cremona, M
de Nicola, E
Kalinov, V
Montereali, RM
Citation: G. Baldacchini et al., Radiationless transitions and kinetics of the F-3(+) centre luminescence in LiF, RADIAT EFF, 149(1-4), 1999, pp. 287-292
Authors:
Santos, HJ
Pinheiro, FA
Takeuchi, AY
Sampaio, LC
Simao, RA
Achete, CA
Cremona, M
Citation: Hj. Santos et al., Uniaxial in-plane magnetic anisotropy and exchange bias in Sm/Fe bilayers, PHYS REV B, 60(1), 1999, pp. 68-71
Authors:
Scacco, A
Bottazzi, R
Baldacchini, G
Montereali, RM
Cremona, M
Grassano, UM
Citation: A. Scacco et al., Thermally activated processes in the relaxed excited states of aggregate color centers in KF : Na, RADIAT EFF, 146(1-4), 1998, pp. 323-329
Authors:
Cremona, M
Mauricio, MHP
Fehlberg, LV
Nunes, RA
do Carmo, LCS
de Avillez, RR
Caride, AO
Citation: M. Cremona et al., Grazing incidence X-ray diffraction analysis of alkali fluoride thin filmsfor optical devices, THIN SOL FI, 333(1-2), 1998, pp. 157-164
Risultati:
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