Authors: DENBOER JHWG KROESEN GMW DEHOOG FJ

Citation: Jhwg. Denboer et al., SPECTROSCOPIC ROTATING COMPENSATOR ELLIPSOMETRY IN THE INFRARED - RETARDER DESIGN AND MEASUREMENT, Measurement science & technology, 8(5), 1997, pp. 484-492

Authors: KROESEN GMW DENBOER JHWG BOUFENDI L VIVET F KHOULI M BOUCHOULE A DEHOOG FJ

Citation: Gmw. Kroesen et al., IN-SITU INFRARED-ABSORPTION SPECTROSCOPY OF DUSTY PLASMAS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(2), 1996, pp. 546-549

Authors: HAVERLAG M STOFFELS WW STOFFELS E DENBOER JHWG KROESEN GMW DEHOOG FJ

Citation: M. Haverlag et al., HIGH-RESOLUTION INFRARED-SPECTROSCOPY OF ETCHING PLASMAS, Plasma sources science & technology, 4(2), 1995, pp. 260-267

Authors: DENBOER JHWG KROESEN GMW DEZEEUW W DEHOOG FJ

Citation: Jhwg. Denboer et al., IMPROVED POLARIZER IN THE INFRARED - 2 WIRE-GRID POLARIZERS IN TANDEM, Optics letters, 20(7), 1995, pp. 800-802

Authors: DENBOER JHWG KROESEN GMW DEHOOG FJ

Citation: Jhwg. Denboer et al., MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX OF LIQUIDS IN THE INFRARED USING SPECTROSCOPIC ATTENUATED TOTAL-REFLECTION ELLIPSOMETRY - CORRECTION FOR DEPOLARIZATION BY SCATTERING, Applied optics, 34(25), 1995, pp. 5708-5714

Authors: DENBOER JHWG KROESEN GMW HAVERLAG M DEHOOG FJ

Citation: Jhwg. Denboer et al., SPECTROSCOPIC IR ELLIPSOMETRY WITH IMPERFECT COMPONENTS, Thin solid films, 234(1-2), 1993, pp. 323-326