Authors:
ILGE B
PALASANTZAS G
DENIJS J
GEERLIGS LJ
Citation: B. Ilge et al., THE TEMPERATURE EVOLUTION OF ULTRA-THIN FILMS IN SOLID-PHASE REACTIONOF CO WITH SI(111) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 414(1-2), 1998, pp. 279-289
Citation: P. Balk et J. Denijs, PROCEEDINGS OF THE 8TH BIENNIAL CONFERENCE ON INSULATING FILMS ON SEMICONDUCTORS - JUNE 2-5, 1993 DELFT, THE NETHERLANDS, Microelectronic engineering, 22(1-4), 1993, pp. 211800011-211800011