Citation: H. Giovannini et al., ANGLE-RESOLVED POLARIMETRIC PHASE MEASUREMENT FOR THE CHARACTERIZATION OF GRATINGS, Optics letters, 21(20), 1996, pp. 1619-1621
Citation: C. Deumie et al., MULTISCALE ROUGHNESS IN OPTICAL MULTILAYERS - ATOMIC-FORCE MICROSCOPYAND LIGHT-SCATTERING, Applied optics, 35(28), 1996, pp. 5583-5594