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Results: 1-7 |
Results: 7
ELECTRICAL CHARACTERIZATION OF SILICON-WAFER BONDING STRUCTURES
Authors: DIMITRAKIS P HATZANDROULIS S TSOUKALAS D STOIMENOS J PAPAIOANNOU GJ
Citation: P. Dimitrakis et al., ELECTRICAL CHARACTERIZATION OF SILICON-WAFER BONDING STRUCTURES, Solid-state electronics, 42(2), 1998, pp. 201-204
SUPER SUPPLEMENT
Authors: DIMITRAKIS P
Citation: P. Dimitrakis, SUPER SUPPLEMENT, Solid state technology, 39(1), 1996, pp. 18-18
ELECTRICAL-PROPERTIES OF BURIED OXIDE-SILICON INTERFACE
Authors: DIMITRAKIS P PAPAIOANNOU GJ CRISTOLOVEANU S
Citation: P. Dimitrakis et al., ELECTRICAL-PROPERTIES OF BURIED OXIDE-SILICON INTERFACE, Journal of applied physics, 80(3), 1996, pp. 1605-1610
EXPERIMENTAL-STUDY OF PASSIVATING ION-BEAM-INDUCED DISTRIBUTED ENERGY-LEVELS IN N-GAAS BY HYDROGEN SPECIES FROM BOILING WATER
Authors: THURZO I PINCIK E PAPAIOANNOU G DIMITRAKIS P ARPATZANIS N
Citation: I. Thurzo et al., EXPERIMENTAL-STUDY OF PASSIVATING ION-BEAM-INDUCED DISTRIBUTED ENERGY-LEVELS IN N-GAAS BY HYDROGEN SPECIES FROM BOILING WATER, Applied surface science, 90(1), 1995, pp. 39-45
ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF WAFER BONDED NON-ANNEALED SIMOX
Authors: TSOUKALAS D DIMITRAKIS P STOEMENOS J PAPAIOANNOU G
Citation: D. Tsoukalas et al., ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF WAFER BONDED NON-ANNEALED SIMOX, Microelectronic engineering, 28(1-4), 1995, pp. 471-474
WANTS MORE ON SOI
Authors: DIMITRAKIS P
Citation: P. Dimitrakis, WANTS MORE ON SOI, Solid state technology, 37(12), 1994, pp. 12-12
CHARACTERIZATION OF THE BURIED OXIDE IN SOI STRUCTURES BY A RATE WINDOW METHOD
Authors: IOANNOUSOUGLERIDIS V PAPAIOANNOU GJ DIMITRAKIS P CRISTOLOVEANU S
Citation: V. Ioannousougleridis et al., CHARACTERIZATION OF THE BURIED OXIDE IN SOI STRUCTURES BY A RATE WINDOW METHOD, Journal of applied physics, 74(5), 1993, pp. 3298-3302
Risultati: 1-7 |