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Results:
1-9
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Results: 9
Authors:
DINNIS AR
Citation: Ar. Dinnis, MICRO-EXTRACTION SPECTROMETER FOR VOLTAGE CONTRAST IN THE SEM, Microelectronic engineering, 42, 1998, pp. 611-614
Authors:
DINNIS AR
Citation: Ar. Dinnis, MICRO-EXTRACTION SPECTROMETER STRUCTURES FOR VOLTAGE CONTRAST IN THE SCANNING ELECTRON-MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2729-2731
Authors:
DINNIS AR
Citation: Ar. Dinnis, EBT MICRO-EXTRACTION STRUCTURES FABRICATED BY FOCUSED ION-BEAM, Microelectronic engineering, 35(1-4), 1997, pp. 447-450
Authors:
DINNIS AR
DINNIS AK
Citation: Ar. Dinnis et Ak. Dinnis, MICRO-EXTRACTION SPECTROMETERS FOR VOLTAGE CONTRAST IN THE SEM, Microelectronics and reliability, 37(10-11), 1997, pp. 1623-1626
Authors:
DINNIS AR
Citation: Ar. Dinnis, A HIGH-RESOLUTION TIME-DISPERSIVE ELECTRON SPECTROMETER FOR FAST VOLTAGE-CONTRAST MEASUREMENTS, Microelectronic engineering, 31(1-4), 1996, pp. 101-108
Authors:
DINNIS AR
Citation: Ar. Dinnis, VOLTAGE CONTRAST MAPS USING THE TIME-DISPERSIVE ELECTRON SPECTROMETER, Microelectronic engineering, 27(1-4), 1995, pp. 523-526
Authors:
DINNIS AR
Citation: Ar. Dinnis, VOLTAGE MEASUREMENTS USING THE TIME-OF-FLIGHT ELECTRON SPECTROMETER, Microelectronic engineering, 24(1-4), 1994, pp. 133-138
Authors:
DINNIS AR
KHURSHEED A
Citation: Ar. Dinnis et A. Khursheed, VOLTAGE MEASUREMENTS ON INTEGRATED-CIRCUITS USING A TIME-OF-FLIGHT ELECTRON SPECTROMETER, Microelectronic engineering, 23(1-4), 1994, pp. 395-398
Authors:
DINNIS AR
KHURSHEED A
Citation: Ar. Dinnis et A. Khursheed, TIME-OF-FLIGHT ELECTRON SPECTROMETER FOR VOLTAGE MEASUREMENTS ON INTEGRATED-CIRCUITS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2452-2455
Risultati:
1-9
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