Authors: DJAHLI F RAHMANI S REMMOUCHE R

Citation: F. Djahli et al., A STATIC MODEL FOR THE SOI TMOS IN STRONG INVERSION, Microelectronic engineering, 43-4, 1998, pp. 587-598

Authors: DJAHLI F KAABI L

Citation: F. Djahli et L. Kaabi, A MACROMODEL IN SMART SPICE TO STUDY MOSFET DEGRADATIONS WITH THE CP TECHNIQUE, Microelectronics, 29(11), 1998, pp. 805-811

Authors: DJAHLI F KAABI L

Citation: F. Djahli et L. Kaabi, A MACRO MODEL IN SMART SPICE TO STUDY THE MOSFET DEGRADATIONS WITH CPTECHNIQUE, International journal of electronics, 82(5), 1997, pp. 471-481

Authors: DJAHLI F AUTRAN JL PLOSSU C

Citation: F. Djahli et al., USE OF THE CHARGE-PUMPING TECHNIQUE TO UNDERSTAND NONUNIFORM N-CHANNEL MOSFET DEGRADATION, Materials science & engineering. B, Solid-state materials for advanced technology, 23(2), 1994, pp. 120-122