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Results: 1-25/75
Authors:
BERTRAND N
DREVILLON B
GHEORGHIU A
SENEMAUD C
MARTINU L
KLEMBERGSAPIEHA JE
Citation: N. Bertrand et al., ADHESION IMPROVEMENT OF PLASMA-DEPOSITED SILICA THIN-FILMS ON STAINLESS-STEEL SUBSTRATE STUDIED BY X-RAY PHOTOEMISSION SPECTROSCOPY AND IN-SITU INFRARED ELLIPSOMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 6-12
Authors:
BERTRAND N
DREVILLON B
BULKIN P
Citation: N. Bertrand et al., IN-SITU INFRARED ELLIPSOMETRY STUDY OF THE GROWTH OF PLASMA-DEPOSITEDSILICA THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 63-71
Authors:
KILDEMO M
DREVILLON B
Citation: M. Kildemo et B. Drevillon, REAL-TIME CONTROL OF THE DEPOSITION OF OPTICAL COATINGS BY MULTIWAVELENGTH ELLIPSOMETRY, Surface & coatings technology, 101(1-3), 1998, pp. 480-485
Authors:
COMPAIN E
DREVILLON B
HUC J
PAREY JY
BOUREE JE
Citation: E. Compain et al., COMPLETE MUELLER MATRIX MEASUREMENT WITH A SINGLE HIGH-FREQUENCY MODULATION, Thin solid films, 313, 1998, pp. 47-52
Authors:
KILDEMO M
DREVILLON B
HUNDERI O
Citation: M. Kildemo et al., A DIRECT ROBUST FEEDBACK METHOD FOR GROWTH-CONTROL OF OPTICAL COATINGS BY MULTIWAVELENGTH ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 484-489
Authors:
DREVILLON B
Citation: B. Drevillon, SPECTROSCOPIC ELLIPSOMETRY IN THE INFRARED RANGE, Thin solid films, 313, 1998, pp. 625-630
Authors:
HEITZ T
DREVILLON B
Citation: T. Heitz et B. Drevillon, IN-SITU INFRARED ELLIPSOMETRY STUDY OF THE GROWTH OF HYDROGENATED AMORPHOUS-CARBON THIN-FILMS, Thin solid films, 313, 1998, pp. 704-707
Authors:
COMPAIN E
DREVILLON B
Citation: E. Compain et B. Drevillon, HIGH-FREQUENCY MODULATION OF THE 4 STATES OF POLARIZATION OF LIGHT WITH A SINGLE-PHASE MODULATOR, Review of scientific instruments, 69(4), 1998, pp. 1574-1580
Authors:
BULKIN P
BRENOT R
DREVILLON B
VANDERHAGHEN R
Citation: P. Bulkin et al., STRUCTURE AND TRANSPORT-PROPERTIES OF INTEGRATED DISTRIBUTED ELECTRON-CYCLOTRON-RESONANCE GROWN MICROCRYSTALLINE SILICON, Journal of non-crystalline solids, 231(3), 1998, pp. 268-272
Authors:
BRENOT R
BULKIN P
CABARROCAS PRI
DREVILLON B
VANDERHAGHEN R
Citation: R. Brenot et al., IN-SITU CHARACTERIZATION OF MICROCRYSTALLINE SILICON BY TIME-RESOLVEDMICROWAVE CONDUCTIVITY, Journal of non-crystalline solids, 230, 1998, pp. 1001-1005
Authors:
LAROCQUE AGD
BERTRAND N
BONNEFONT PA
BULKIN P
DREVILLON B
SENEMAUD C
Citation: Agd. Larocque et al., X-RAY PHOTOELECTRON-SPECTRA OF ADHESION-ENHANCED A-SI-H ON STAINLESS-STEEL INDUCED BY PLASMA TREATMENTS, Journal of non-crystalline solids, 230, 1998, pp. 59-62
Authors:
BOUREE JE
HEITZ T
GODET C
DREVILLON B
CONDE JP
CHU V
BERBERANSANTOS MN
FEDOROV A
Citation: Je. Bouree et al., PHOTOLUMINESCENCE OF POLYMER-LIKE AMORPHOUS-CARBON FILMS GROWN IN DIFFERENT PLASMA REACTORS, Journal of non-crystalline solids, 230, 1998, pp. 574-578
Authors:
HEITZ T
DREVILLON B
BOUREE JE
GODET C
Citation: T. Heitz et al., EARLY STAGES OF THE GROWTH OF HYDROGENATED AMORPHOUS-CARBON INVESTIGATED BY IN-SITU INFRARED ELLIPSOMETRY, Journal of non-crystalline solids, 230, 1998, pp. 636-640
Authors:
GODET C
HEITZ T
BOUREE JE
DREVILLON B
CLERC C
Citation: C. Godet et al., GROWTH AND COMPOSITION OF DUAL-PLASMA POLYMER-LIKE AMORPHOUS-CARBON FILMS, Journal of applied physics, 84(7), 1998, pp. 3919-3932
Authors:
HEITZ T
DREVILLON B
BOUREE JE
GODET C
Citation: T. Heitz et al., IN-SITU INFRARED ELLIPSOMETRY STUDY OF HYDROGENATED AMORPHOUS CARBON SI INTERFACE FORMATION/, Applied physics letters, 72(7), 1998, pp. 780-782
Authors:
COMPAIN E
DREVILLON B
Citation: E. Compain et B. Drevillon, BROAD-BAND DIVISION-OF-AMPLITUDE POLARIMETER BASED ON UNCOATED PRISMS, Applied optics, 37(25), 1998, pp. 5938-5944
Authors:
KILDEMO M
BRENOT R
DREVILLON B
Citation: M. Kildemo et al., SPECTROELLIPSOMETRIC METHOD FOR PROCESS MONITORING SEMICONDUCTOR THIN-FILMS AND INTERFACES, Applied optics, 37(22), 1998, pp. 5145-5149
Authors:
KILDEMO M
HUNDERI O
DREVILLON B
Citation: M. Kildemo et al., APPROXIMATION OF REFLECTION COEFFICIENTS FOR RAPID REAL-TIME CALCULATION OF INHOMOGENEOUS FILMS, Journal of the Optical Society of America. A, Optics, image science,and vision., 14(4), 1997, pp. 931-939
Authors:
PONCINEPAILLARD F
VALLON S
DREVILLON B
Citation: F. Poncinepaillard et al., ILLUSTRATION OF SURFACE CROSS-LINKING OF DIFFERENT POLYMERS TREATED IN ARGON PLASMA, Macromolecular chemistry and physics, 198(8), 1997, pp. 2439-2456
Authors:
VALLON S
JOUBERT O
VALLIER L
FERRIEU F
DREVILLON B
BLAYO N
Citation: S. Vallon et al., REAL-TIME ULTRAVIOLET ELLIPSOMETRY MONITORING OF GATE PATTERNING IN AHIGH-DENSITY PLASMA, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 865-870
Authors:
ETEMADI R
GODET C
PERRIN J
DREVILLON B
HUC J
PAREY JY
ROSTAING JC
COEURET F
Citation: R. Etemadi et al., DUAL-PLASMA REACTOR FOR LOW-TEMPERATURE DEPOSITION OF WIDE BAND-GAP SILICON ALLOYS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(2), 1997, pp. 320-331
Authors:
BERTRAND N
BULKIN P
DREVILLON B
LUCAS S
BENAYOUN S
Citation: N. Bertrand et al., IN-SITU INFRARED ELLIPSOMETRY STUDY OF PLASMA PROCESSING OF METALLIC SURFACES, Surface & coatings technology, 94-5(1-3), 1997, pp. 362-367
Authors:
VALLON S
DREVILLON B
PONCINEPAILLARD F
Citation: S. Vallon et al., IN-SITU SPECTROELLIPSOMETRY STUDY OF THE CROSS-LINKING OF POLYPROPYLENE BY AN ARGON PLASMA, Applied surface science, 108(1), 1997, pp. 177-185
Authors:
BULKIN P
BERTRAND N
DREVILLON B
ROSTAING JC
DELMOTTE F
HUGON MC
AGIUS B
Citation: P. Bulkin et al., PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF SILICA THIN-FILMS IN AN INTEGRATED DISTRIBUTED ELECTRON-CYCLOTRON-RESONANCE REACTOR, Thin solid films, 308, 1997, pp. 63-67
Authors:
DREVILLON B
Citation: B. Drevillon, THIN-FILM MATERIALS FOR LARGE-AREA ELECTRONICS, Thin solid films, 296(1-2), 1997, pp. 1-1