Authors: MARTIN A DUANE R OSULLIVAN P MATHEWSON A

Citation: A. Martin et al., DEPENDENCE OF GATE OXIDE BREAKDOWN ON INITIAL CHARGE TRAPPING UNDER FOWLER-NORDHEIM INJECTION, Microelectronics and reliability, 38(6-8), 1998, pp. 1091-1096

Authors: DUANE R MARTIN A ODONOVAN P HURLEY P OSULLIVAN P MATHEWSON A

Citation: R. Duane et al., INVESTIGATION OF TRAPPED CHARGE IN OXIDES UNDER FOWLER-NORDHEIM STRESS USING LOW-BIAS CONDITIONS, Microelectronics and reliability, 36(11-12), 1996, pp. 1623-1626