ACNP - Italian Periodicals Catalogue

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Results: 1-9 |

Results: 9

ANALYSIS OF THE MECHANICAL RESPONSE OF FILM ON SUBSTRATE SYSTEMS PRESENTING ROUGH INTERFACES

Authors: BORDET H IGNAT M DUPEUX M

Citation: H. Bordet et al., ANALYSIS OF THE MECHANICAL RESPONSE OF FILM ON SUBSTRATE SYSTEMS PRESENTING ROUGH INTERFACES, Thin solid films, 315(1-2), 1998, pp. 207-213

CHARACTERIZATION OF W FILMS ON SI AND SIO2 SI SUBSTRATES BY X-RAY-DIFFRACTION, AFM AND BLISTER TEST ADHESION MEASUREMENTS/

Authors: BOSSEBOEUF A DUPEUX M BOUTRY M BOUROUINA T BOUCHIER D DEBARRE D

Citation: A. Bosseboeuf et al., CHARACTERIZATION OF W FILMS ON SI AND SIO2 SI SUBSTRATES BY X-RAY-DIFFRACTION, AFM AND BLISTER TEST ADHESION MEASUREMENTS/, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 261-272

SIMS PROFILING OF METALLIC MULTILAYERS CO CU/CO - EFFECTS OF BOMBARDMENT PARAMETERS ON DEPTH RESOLUTION/

Authors: DUPEUX M PERDEREAU M

Citation: M. Dupeux et M. Perdereau, SIMS PROFILING OF METALLIC MULTILAYERS CO CU/CO - EFFECTS OF BOMBARDMENT PARAMETERS ON DEPTH RESOLUTION/, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 273-286

ELASTIC PROPERTIES OF SILICON DIOXIDE FILMS DEPOSITED BY CHEMICAL-VAPOR-DEPOSITION FROM TETRAETHYLORTHOSILICATE

Authors: CARLOTTI G DOUCET L DUPEUX M

Citation: G. Carlotti et al., ELASTIC PROPERTIES OF SILICON DIOXIDE FILMS DEPOSITED BY CHEMICAL-VAPOR-DEPOSITION FROM TETRAETHYLORTHOSILICATE, Thin solid films, 296(1-2), 1997, pp. 102-105

COMPARATIVE-STUDY OF THE ELASTIC PROPERTIES OF SILICATE GLASS-FILMS GROWN BY PLASMA-ENHANCED CHEMICAL-VAPOR

Authors: CARLOTTI G DOUCET L DUPEUX M

Citation: G. Carlotti et al., COMPARATIVE-STUDY OF THE ELASTIC PROPERTIES OF SILICATE GLASS-FILMS GROWN BY PLASMA-ENHANCED CHEMICAL-VAPOR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3460-3464

NONDESTRUCTIVE BULK DETECTION OF LOCALIZED STRAINING BY GAMMA-RAY DIFFRACTOMETRY - APPLICATION TO A SHEARED SINGLE-CRYSTAL OF CMSX3-2 SUPERALLOY

Authors: MANIGUET L BASTIE P BELLET D DUPEUX M

Citation: L. Maniguet et al., NONDESTRUCTIVE BULK DETECTION OF LOCALIZED STRAINING BY GAMMA-RAY DIFFRACTOMETRY - APPLICATION TO A SHEARED SINGLE-CRYSTAL OF CMSX3-2 SUPERALLOY, Physica status solidi. a, Applied research, 148(2), 1995, pp. 389-406

HIGH-TEMPERATURE TENSILE CREEP OF CMSX-2 NICKEL-BASE SUPERALLOY SINGLE-CRYSTALS

Authors: ROUAULTROGEZ H DUPEUX M IGNAT M

Citation: H. Rouaultrogez et al., HIGH-TEMPERATURE TENSILE CREEP OF CMSX-2 NICKEL-BASE SUPERALLOY SINGLE-CRYSTALS, Acta metallurgica et materialia, 42(9), 1994, pp. 3137-3148

APPLICATION OF BINARY INTERDIFFUSION MODELS TO GAMMA'(NI3AL) GAMMA(NI) DIFFUSION-BONDED INTERFACES/

Authors: DUPEUX M WAN CG WILLEMIN P

Citation: M. Dupeux et al., APPLICATION OF BINARY INTERDIFFUSION MODELS TO GAMMA'(NI3AL) GAMMA(NI) DIFFUSION-BONDED INTERFACES/, Acta metallurgica et materialia, 41(11), 1993, pp. 3071-3076

SOLID-STATE BONDING OF SINGLE-CRYSTALS OF NI(111) AL2O3(0001)/

Authors: WAN C DUPEUX M

Citation: C. Wan et M. Dupeux, SOLID-STATE BONDING OF SINGLE-CRYSTALS OF NI(111) AL2O3(0001)/, Journal of Materials Science, 28(18), 1993, pp. 5079-5087

Risultati: 1-9 |