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Aharony, D
Albert, JS
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Davenport, T
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Kosmider, BJ
Kirkland, K
Ohnmacht, CJ
Potts, W
Rumsey, WL
Shen, LH
Shenvi, A
Sherwood, S
Stollman, D
Russell, K
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Authors:
Mutch, C
Tobin, M
Hickie, I
Davenport, T
Burke, D
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Citation: T. Davenport et S. Mitra, Process variations in use for the first generations of FRAM (R) memory products, INTEGR FERR, 31(1-4), 2000, pp. 213-231
Citation: T. Davenport et al., Ultrasonic and atomic force studies of the martensitic transformation induced by temperature and uniaxial stress in NiAl alloys, PHYS REV B, 59(5), 1999, pp. 3421-3426