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Results: 1-5 |
Results: 5

Authors: De, I Gupta, B
Citation: I. De et B. Gupta, Efficient fault tolerant multicasting in hybrid incomplete hypercube interconnection networks, COMP SYS SC, 16(1), 2001, pp. 51-60

Authors: Osburn, CM De, I Yee, KF Srivastava, A
Citation: Cm. Osburn et al., Design and integration considerations for end-of-the roadmap ultrashallow junctions, J VAC SCI B, 18(1), 2000, pp. 338-345

Authors: De, I Johri, D Srivastava, A Osburn, CM
Citation: I. De et al., Impact of gate workfunction on device performance at the 50 nm technology node, SOL ST ELEC, 44(6), 2000, pp. 1077-1080

Authors: Ahmed, K De, I Osburn, C Wortman, J Hauser, J
Citation: K. Ahmed et al., Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's, IEEE DEVICE, 47(4), 2000, pp. 891-895

Authors: De, I Osburn, CM
Citation: I. De et Cm. Osburn, Impact of super-steep-retrograde channel doping profiles on the performance of scaled devices, IEEE DEVICE, 46(8), 1999, pp. 1711-1717
Risultati: 1-5 |