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Results:
1-16
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Results: 16
Authors:
Zhao, C
Roebben, G
Bender, H
Young, E
Haukka, S
Houssa, M
Naili, M
De Gendt, S
Heyns, M
Van Der Biest, O
Citation: C. Zhao et al., In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction, MICROEL REL, 41(7), 2001, pp. 995-998
Authors:
De Smedt, F
De Gendt, S
Heyns, MM
Vinckier, C
Citation: F. De Smedt et al., The application of ozone in semiconductor cleaning processes - The solubility issue, J ELCHEM SO, 148(9), 2001, pp. G487-G493
Authors:
Claes, M
De Gendt, S
Kenens, C
Conard, T
Bender, H
Storm, W
Bauer, T
Mertens, P
Citation: M. Claes et al., Controlled deposition of organic contamination and removal with ozone-based cleanings, J ELCHEM SO, 148(3), 2001, pp. G118-G125
Authors:
Stuyver, L
Van Geyt, C
De Gendt, S
Van Reybroeck, G
Zoulim, F
Leroux-Roels, G
Rossau, R
Citation: L. Stuyver et al., Line probe assay for monitoring drug resistance in hepatitis B virus-infected patients during antiviral therapy, J CLIN MICR, 38(2), 2000, pp. 702-707
Authors:
Monaghan, ML
Nigam, T
Houssa, M
De Gendt, S
Urbach, HP
de Bokx, PK
Citation: Ml. Monaghan et al., Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry, THIN SOL FI, 359(2), 2000, pp. 197-202
Authors:
Stuyver, L
De Gendt, S
Van Geyt, C
Zoulim, F
Fried, M
Schinazi, RF
Rossau, R
Citation: L. Stuyver et al., A new genotype of hepatitis B virus: complete genome and phylogenetic relatedness, J GEN VIROL, 81, 2000, pp. 67-74
Authors:
De Witte, H
De Gendt, S
Douglas, M
Conard, T
Kenis, K
Mertens, PW
Vandervorst, W
Gijbels, R
Citation: H. De Witte et al., Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on Si wafer surfaces, J ELCHEM SO, 147(5), 2000, pp. 1915-1919
Authors:
De Smedt, F
Vinckier, C
Cornelissen, I
De Gendt, S
Heyns, M
Citation: F. De Smedt et al., A detailed study on the growth of thin oxide layers on silicon using ozonated solutions, J ELCHEM SO, 147(3), 2000, pp. 1124-1129
Authors:
Stuyver, L
De Gendt, S
Cadranel, JF
Van Geyt, C
Van Reybroeck, G
Dorent, R
Gandjbachkh, I
Rosenheim, M
Charlotte, F
Opolon, P
Huraux, JM
Lunel, F
Citation: L. Stuyver et al., Three cases of severe subfulminant hepatitis in heart-transplanted patients after nosocomial transmission of a mutant hepatitis B virus, HEPATOLOGY, 29(6), 1999, pp. 1876-1883
Authors:
Houssa, M
De Gendt, S
de Bokx, P
Mertens, PW
Heyns, MM
Citation: M. Houssa et al., Effect of x-ray irradiation on the electrical characteristics of ultra-thin gate oxides, SEMIC SCI T, 14(9), 1999, pp. 741-746
Authors:
Houssa, M
De Gendt, S
de Bokx, P
Mertens, PW
Heyns, MM
Citation: M. Houssa et al., X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides, MICROEL ENG, 48(1-4), 1999, pp. 43-46
Authors:
Mertens, PW
Bearda, T
Houssa, M
Loewenstein, LM
Cornelissen, I
De Gendt, S
Kenis, K
Teerlinck, I
Vos, R
Meuris, M
Heyns, MM
Citation: Pw. Mertens et al., Advanced cleaning for the growth of ultrathin gate oxide, MICROEL ENG, 48(1-4), 1999, pp. 199-206
Authors:
Heyns, MM
Bearda, T
Cornelissen, I
De Gendt, S
Degraeve, R
Groeseneken, G
Kenens, C
Knotter, DM
Loewenstein, LM
Mertens, PW
Mertens, S
Meuris, M
Nigam, T
Schaekers, M
Teerlinck, I
Vandervorst, W
Vos, R
Wolke, K
Citation: Mm. Heyns et al., Cost-effective cleaning and high-quality thin gate oxides, IBM J RES, 43(3), 1999, pp. 339-350
Authors:
De Smedt, F
Stevens, G
De Gendt, S
Cornelissen, I
Arnauts, S
Meuris, M
Heyns, MM
Vinckier, C
Citation: F. De Smedt et al., A wet chemical method for the determination of thickness of SiO2 layers below the nanometer level, J ELCHEM SO, 146(5), 1999, pp. 1873-1878
Authors:
De Gendt, S
Wauters, J
Heyns, M
Citation: S. De Gendt et al., A novel resist and post-etch residue removal process using ozonated chemistry, SOL ST TECH, 41(12), 1998, pp. 57
Authors:
Van Geyt, C
De Gendt, S
Rombout, A
Wyseur, A
Maertens, G
Rossau, R
Stuyver, L
Citation: C. Van Geyt et al., A line probe assay for hepatitis B virus genotypes, THERAPIES FOR VIRAL HEPATITIS, 1998, pp. 139-145
Risultati:
1-16
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