Citation: Jw. Tringe et al., A diffraction-based transmission electron microscope technique for measuring average grain size, EL SOLID ST, 3(11), 2000, pp. 520-523
Citation: D. Kim et al., Creep-controlled diffusional hillock formation in blanket aluminum thin films as a mechanism of stress relaxation, J MATER RES, 15(8), 2000, pp. 1709-1718
Citation: Jw. Tringe et al., Transparent probe test structure for electrical and physical characterization of defects in thin films, J ELCHEM SO, 147(12), 2000, pp. 4633-4638