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Results: 3
SiGeHBT for application in BiCMOS technology: II. Design, technology and performance
Authors: Jain, SC Decoutere, S Willander, M Maes, HE
Citation: Sc. Jain et al., SiGeHBT for application in BiCMOS technology: II. Design, technology and performance, SEMIC SCI T, 16(7), 2001, pp. R67-R85
SiGeHBTs for application in BiCMOS technology: I. Stability, reliability and material parameters
Authors: Jain, SC Decoutere, S Willander, M Maes, HE
Citation: Sc. Jain et al., SiGeHBTs for application in BiCMOS technology: I. Stability, reliability and material parameters, SEMIC SCI T, 16(6), 2001, pp. R51-R65
Measurement and simulation of boron diffusion in strained Si1-xGex epitaxial layers
Authors: Rajendran, K Schoenmaker, W Decoutere, S Loo, R Caymax, M Vandervorst, W
Citation: K. Rajendran et al., Measurement and simulation of boron diffusion in strained Si1-xGex epitaxial layers, IEEE DEVICE, 48(9), 2001, pp. 2022-2031
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