Authors:
Degardin, AF
Schneegans, O
Houze, F
Caristan, E
De Luca, A
Chretien, P
Boyer, L
Kreisler, AJ
Citation: Af. Degardin et al., Atomic force microscopy with a conducting tip: correlation studies betweenmicrostructure and electrical properties of YBaCuO thin films, PHYSICA C, 341, 2000, pp. 1965-1968