Authors: Caignet, F Delmas-Bendhia, S Sicard, E

Citation: F. Caignet et al., The challenge of signal integrity in deep-submicrometer CMOS technology, P IEEE, 89(4), 2001, pp. 556-573

Authors: Delmas-Bendhia, S Caignet, F Sicard, E Roca, M

Citation: S. Delmas-bendhia et al., On-chip sampling in CMOS integrated circuits, IEEE ELMAGN, 41(4), 1999, pp. 403-406