Authors: Dementjev, AP

Citation: Ap. Dementjev, Electron spectroscopy characterization of carbon surfaces, NEW DIAM FR, 11(1), 2001, pp. 37-51

Authors: Mitu, B Dinescu, G Dinescu, M Ferrari, A Balucani, M Lamedica, G Dementjev, AP Maslakov, KI

Citation: B. Mitu et al., Multilayer structures induced by plasma and laser beam treatments on a-Si : H and a-SiC : H thin films, THIN SOL FI, 383(1-2), 2001, pp. 230-234

Authors: Dementjev, AP de Graaf, A van de Sanden, MCM Maslakov, KI Naumkin, AV Serov, AA

Citation: Ap. Dementjev et al., X-ray photoelectron spectroscopy reference data for identification of the C3N4 phase in carbon-nitrogen films, DIAM RELAT, 9(11), 2000, pp. 1904-1907

Authors: Bacal, M Perriere, J Tanguy, M Vesselovzorov, AN Maslakov, KI Dementjev, AP

Citation: M. Bacal et al., Study of carbon nitride films deposited using a Hall-type ion source, J PHYS D, 33(19), 2000, pp. 2373-2378

Authors: Teterin, YA Teterin, AY Lebedev, AM Dementjev, AP Utkin, IO Nefedov, VI Bubner, M Reich, T Pompe, S Heise, KH Nitsche, H

Citation: Ya. Teterin et al., X-ray photoelectron spectroscopy investigation of the interaction of U(VI)and Fe(III) with natural humic acid in aqueous solutions, J PRAK CH C, 341(8), 1999, pp. 773-777

Authors: Dementjev, AP de Graaf, A Dolgiy, DI Olshanski, ED Shulga, YM Serov, AA

Citation: Ap. Dementjev et al., CNx film characterization by surface sensitive methods: XPS and XAES, DIAM RELAT, 8(2-5), 1999, pp. 601-604