Authors:
Re, M
Scalese, S
Mirabella, S
Terrasi, A
Priolo, F
Rimini, E
Berti, M
Coati, A
Drigo, A
Carnera, A
De Salvador, D
Spinella, C
La Mantia, A
Citation: M. Re et al., Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy, J CRYST GR, 227, 2001, pp. 749-755
Authors:
Romanato, F
Natali, M
Napolitani, E
Drigo, A
Citation: F. Romanato et al., Computation of the strain field generated by dislocations with a position-dependent Burgers' vector distribution, MICRON, 31(3), 2000, pp. 277-283
Authors:
DeVittorio, M
Coli, G
Rinaldi, R
Gigli, G
Cingolani, R
De Salvador, D
Berti, M
Drigo, A
Fucilli, F
Ligonzo, T
Augelli, V
Rizzi, A
Lantier, R
Freundt, D
Luth, H
Neubauer, B
Gerthsen, D
Citation: M. Devittorio et al., Photocurrent spectroscopy of GaN and AlGaN epilayers grown on 6H (0001) silicon carbide, SOL ST ELEC, 44(3), 2000, pp. 465-470
Authors:
Tormen, M
De Salvador, D
Natali, M
Drigo, A
Romanato, F
Rossetto, G
Boscherini, F
Mobilio, S
Citation: M. Tormen et al., Bond length variation in In0.25Ga0.75As/InP epitaxial layers thicker than the critical thickness, J APPL PHYS, 86(5), 1999, pp. 2533-2539