Citation: Yf. Dufrene, Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells, MICRON, 32(2), 2001, pp. 153-165
Authors:
Dufrene, YF
Boonaert, CJP
van der Mei, HC
Busscher, HJ
Rouxhet, PG
Citation: Yf. Dufrene et al., Probing molecular interactions and mechanical properties of microbial cellsurfaces by atomic force microscopy, ULTRAMICROS, 86(1-2), 2001, pp. 113-120
Citation: Cjp. Boonaert et al., Surface properties of microbial cells probed at the nanometre scale with atomic force microscopy, SURF INT AN, 30(1), 2000, pp. 32-35
Citation: Yf. Dufrene, Direct characterization of the physicochemical properties of fungal sporesusing functionalized AFM probes, BIOPHYS J, 78(6), 2000, pp. 3286-3291
Authors:
van der Mei, HC
Busscher, HJ
Bos, R
de Vries, J
Boonaert, CJP
Dufrene, YF
Citation: Hc. Van Der Mei et al., Direct probing by atomic force microscopy of the cell surface softness of a fibrillated and nonfibrillated oral streptococcal strain, BIOPHYS J, 78(5), 2000, pp. 2668-2674
Citation: Yf. Dufrene et Gu. Lee, Advances in the characterization of supported lipid films with the atomic force microscope, BBA-BIOMEMB, 1509(1-2), 2000, pp. 14-41
Citation: Yf. Dufrene et al., Influence of substratum surface properties on the organization of adsorbedcollagen films: In situ characterization by atomic force microscopy, LANGMUIR, 15(8), 1999, pp. 2871-2878
Citation: Yf. Dufrene et al., Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling, APPL SURF S, 145, 1999, pp. 638-643
Citation: Yf. Dufrene et al., Surface analysis by X-ray photoelectron spectroscopy in study of bioadhesion and biofilms, METH ENZYM, 310, 1999, pp. 375-389
Authors:
Dufrene, YF
Boonaert, CJP
Gerin, PA
Asther, M
Rouxhet, PG
Citation: Yf. Dufrene et al., Direct probing of the surface ultrastructure and molecular interactions ofdormant and germinating spores of Phanerochaete chrysosporium, J BACT, 181(17), 1999, pp. 5350-5354
Citation: Yf. Dufrene et al., Characterization of the physical properties of model biomembranes at the nanometer scale with the atomic force microscope, FARADAY DIS, (111), 1998, pp. 79-94