Authors: Qian, D Dumin, DJ

Citation: D. Qian et Dj. Dumin, The field, time and fluence dependencies of trap generation in silicon oxides between 5 and 13.5 nm thick, SEMIC SCI T, 15(8), 2000, pp. 854-861

Authors: Jackson, JC Oralkan, O Dumin, DJ Brown, GA

Citation: Jc. Jackson et al., Electric breakdowns and breakdown mechanisms in ultrathin silicon oxides, MICROEL REL, 39(2), 1999, pp. 171-179

Authors: Chen, Y Singh, R Rajan, K Dumin, DJ DeBoer, S Thakur, RPS

Citation: Y. Chen et al., A study of rapid photothermal annealing on the electrical properties and reliability of tantalum pentoxide, IEEE DEVICE, 46(4), 1999, pp. 814-816