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Results: 1-25 | 26-27 |
Results: 26-27/27
RECOVERY OF SUBMICROMETER PMOSFETS FROM HOT-CARRIER DEGRADATION BY HIGH-FIELD INJECTION
Authors: ZHANG JF TAYLOR S ECCLESTON W BARLOW K
Citation: Jf. Zhang et al., RECOVERY OF SUBMICROMETER PMOSFETS FROM HOT-CARRIER DEGRADATION BY HIGH-FIELD INJECTION, Electronics Letters, 29(12), 1993, pp. 1097-1099
A NOVEL TECHNIQUE FOR THE MEASUREMENT OF GENERATION LIFETIME IN UNDOPED POLYSILICON MATERIAL USING THE PRINCIPLE OF CHARGE CENTROIDS
Authors: MCDAID LJ HALL S ECCLESTON W
Citation: Lj. Mcdaid et al., A NOVEL TECHNIQUE FOR THE MEASUREMENT OF GENERATION LIFETIME IN UNDOPED POLYSILICON MATERIAL USING THE PRINCIPLE OF CHARGE CENTROIDS, Semiconductor science and technology, 6(10), 1991, pp. 1032-1035
Risultati: 1-25 | 26-27 |