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IVANOV IG
EGILSSON T
HENRY A
KORDINA O
JANZEN E
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Authors:
KIES R
EGILSSON T
GHIBAUDO G
PANANAKAKIS G
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Authors:
KIES R
EGILSSON T
GHIBAUDO G
PANANAKAKIS G
Citation: R. Kies et al., A METHOD FOR THE ASSESSMENT OF OXIDE CHARGE-DENSITY AND CENTROID IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES AFTER UNIFORM GATE STRESS, Applied physics letters, 68(26), 1996, pp. 3790-3792
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