Authors:
JEFFERY A
ELMQUIST RE
SHIELDS JQ
LEE LH
CAGE ME
SHIELDS SH
DZIUBA RF
Citation: A. Jeffery et al., DETERMINATION OF THE VONKLITZING CONSTANT AND THE FINE-STRUCTURE CONSTANT THROUGH A COMPARISON OF THE QUANTIZED HALL RESISTANCE AND THE OHMDERIVED FROM THE NIST CALCULABLE CAPACITOR, Metrologia, 35(2), 1998, pp. 83-96
Authors:
JEFFERY AM
ELMQUIST RE
LEE LH
SHIELDS JQ
DZIUBA RF
Citation: Am. Jeffery et al., NIST COMPARISON OF THE QUANTIZED HALL RESISTANCE AND THE REALIZATION OF THE SI OHM THROUGH THE CALCULABLE CAPACITOR, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 264-268
Citation: Re. Elmquist et Rf. Dziuba, LOADING EFFECTS IN RESISTANCE SCALING, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 322-324
Citation: A. Jeffery et al., PRECISION TESTS OF QUANTUM HALL-EFFECT DEVICE DC EQUIVALENT-CIRCUIT USING DOUBLE-SERIES AND TRIPLE-SERIES CONNECTIONS, Journal of research of the National Institute of Standards and Technology, 100(6), 1995, pp. 677-685
Citation: Re. Elmquist et Rf. Dziuba, HIGH-TEMPERATURE SUPERCONDUCTOR CRYOGENIC CURRENT COMPARATOR, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 262-264
Citation: Cf. Lavine et al., SPECTROSCOPIC STUDY OF QUANTIZED BREAKDOWN VOLTAGE STATES OF THE QUANTUM HALL-EFFECT, Journal of research of the National Institute of Standards and Technology, 99(6), 1994, pp. 757-764
Citation: Rf. Dziuba et Re. Elmquist, IMPROVEMENTS IN RESISTANCE SCALING AT NIST USING CRYOGENIC CURRENT COMPARTORS, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 126-130
Citation: Re. Elmquist, LEAKAGE CURRENT DETECTION IN CRYOGENIC CURRENT COMPARATOR BRIDGES, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 167-169