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Results: 8

Authors: JEFFERY A ELMQUIST RE SHIELDS JQ LEE LH CAGE ME SHIELDS SH DZIUBA RF
Citation: A. Jeffery et al., DETERMINATION OF THE VONKLITZING CONSTANT AND THE FINE-STRUCTURE CONSTANT THROUGH A COMPARISON OF THE QUANTIZED HALL RESISTANCE AND THE OHMDERIVED FROM THE NIST CALCULABLE CAPACITOR, Metrologia, 35(2), 1998, pp. 83-96

Authors: JEFFERY AM ELMQUIST RE LEE LH SHIELDS JQ DZIUBA RF
Citation: Am. Jeffery et al., NIST COMPARISON OF THE QUANTIZED HALL RESISTANCE AND THE REALIZATION OF THE SI OHM THROUGH THE CALCULABLE CAPACITOR, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 264-268

Authors: ELMQUIST RE DZIUBA RF
Citation: Re. Elmquist et Rf. Dziuba, LOADING EFFECTS IN RESISTANCE SCALING, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 322-324

Authors: JEFFERY A ELMQUIST RE CAGE ME
Citation: A. Jeffery et al., PRECISION TESTS OF QUANTUM HALL-EFFECT DEVICE DC EQUIVALENT-CIRCUIT USING DOUBLE-SERIES AND TRIPLE-SERIES CONNECTIONS, Journal of research of the National Institute of Standards and Technology, 100(6), 1995, pp. 677-685

Authors: ELMQUIST RE DZIUBA RF
Citation: Re. Elmquist et Rf. Dziuba, HIGH-TEMPERATURE SUPERCONDUCTOR CRYOGENIC CURRENT COMPARATOR, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 262-264

Authors: LAVINE CF CAGE ME ELMQUIST RE
Citation: Cf. Lavine et al., SPECTROSCOPIC STUDY OF QUANTIZED BREAKDOWN VOLTAGE STATES OF THE QUANTUM HALL-EFFECT, Journal of research of the National Institute of Standards and Technology, 99(6), 1994, pp. 757-764

Authors: DZIUBA RF ELMQUIST RE
Citation: Rf. Dziuba et Re. Elmquist, IMPROVEMENTS IN RESISTANCE SCALING AT NIST USING CRYOGENIC CURRENT COMPARTORS, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 126-130

Authors: ELMQUIST RE
Citation: Re. Elmquist, LEAKAGE CURRENT DETECTION IN CRYOGENIC CURRENT COMPARATOR BRIDGES, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 167-169
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