Authors:
KURMAEV EZ
ELOKHINA LV
FEDORENKO VV
BARTKOWSKI S
NEUMANN M
GREAVES C
EDWARDS PP
SLATER PR
FRANCESCONI MG
Citation: Ez. Kurmaev et al., X-RAY-EMISSION AND PHOTOELECTRON-SPECTRA, AND THE LOCATION OF FLUORINE-ATOMS IN STRONTIUM AND CALCIUM COPPER OXYFLUORIDES, Journal of physics. Condensed matter, 8(26), 1996, pp. 4847-4854
Authors:
KURMAEV EZ
GALAKHOV VR
FEDORENKO VV
ELOKHINA LV
BARTKOWSKI S
NEUMANN M
GREAVES C
EDWARDS PP
ALMAMOURI M
NOVIKOV DL
Citation: Ez. Kurmaev et al., X-RAY-EMISSION, PHOTOELECTRON-SPECTRA, AND ELECTRONIC-STRUCTURE OF SR2CUO2F2+DELTA, Physical review. B, Condensed matter, 52(4), 1995, pp. 2390-2394
Authors:
YARMOSHENKO YM
KOROTIN MA
TROFIMOVA VA
GALAKHOV VR
ELOKHINA LV
KURMAEV EZ
UHLENBROCK S
NEUMANN M
SLATER PR
GREAVES C
Citation: Ym. Yarmoshenko et al., ELECTRONIC-STRUCTURE OF CUPRATES CONTAINING SULFUR AND PHOSPHORUS OXYANIONS, Physical review. B, Condensed matter, 52(16), 1995, pp. 11830-11836
Citation: Ez. Kurmaev et al., X-RAY-EMISSION SPECTRA AND ANALYSIS OF F-DOPING OF BI2212 COMPOUND, Physica. C, Superconductivity, 226(1-2), 1994, pp. 58-60
Authors:
FEDORENKO VV
GALAKHOV VR
ELOKHINA LV
FINKELSTEIN LD
NAISH VE
KURMAEV EZ
BUTORIN SM
NORDGREN EJ
TYAGI AK
RAO URK
IYER RM
Citation: Vv. Fedorenko et al., ANALYSIS OF FLUORINE INCORPORATION INTO YBA2CU3O6.5-RAY-EMISSION SPECTROSCOPY(DELTA BY MEANS OF X), Physica. C, Superconductivity, 221(1-2), 1994, pp. 71-75
Authors:
FINKELSTEIN LD
GALAKHOV VR
FEDORENKO VV
ELOKHINA LV
SAMOKHVALOV AA
KURMAEV EZ
BUTORIN SM
NORDGREN J
SLOBODIN BV
TETERIN YA
SOSULNIKOV MI
Citation: Ld. Finkelstein et al., X-RAY-EMISSION SPECTRA AND ELECTRONIC-STRUCTURE OF HIGH-T(C) SUPERCONDUCTORS AND BINARY OXIDES, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 431-438
Authors:
FINKELSTEIN LD
GALAKHOV VR
FEDORENKO VV
ELOKHINA LV
SAMOKHVALOV AA
KURMAEV EZ
BUTORIN SM
NORDGREN J
SLOBODIN BV
TETERIN YA
SOSULNIKOV MI
Citation: Ld. Finkelstein et al., OXYGEN-CATION INTERACTIONS IN SUPERCONDUCTING CUPRATES AND RELATED-COMPOUNDS, Solid state communications, 90(12), 1994, pp. 769-772
Authors:
GALAKHOV VR
KURMAEV EZ
SHAMIN SN
ELOKHINA LV
YARMOSHENKO YM
BUKHARAEV AA
Citation: Vr. Galakhov et al., ANALYSIS OF THE DEPTH PROFILE OF FE-SI BURIED LAYERS IN FE-IMPLANTED SI WAFER BY SOFT-X-RAY EMISSION-SPECTROSCOPY(), Applied surface science, 72(1), 1993, pp. 73-77
Authors:
YARMOSHENKO YM
TROFIMOVA VA
ELOKHINA LV
KURMAEV EZ
BUTORIN S
CLOOTS R
AUSLOOS M
AGUIAR JA
LOBATCHEVSKAYA NI
Citation: Ym. Yarmoshenko et al., POSSIBILITY OF SULFUR-OXYGEN SUBSTITUTION IN YBA2CU3O6-RAY-EMISSION SPECTROSCOPY(XSY ANALYZED BY MEANS OF X), Journal of physics and chemistry of solids, 54(10), 1993, pp. 1211-1214