Citation: P. Tran et Jm. Elson, BANDED METHOD OF ORDERED MULTIPLE INTERACTION FOR THE SCATTERING OF ELECTROMAGNETIC-WAVES FROM A ROUGH-SURFACE, Journal of the Optical Society of America. A, Optics, image science,and vision., 15(6), 1998, pp. 1643-1646
Citation: V. Malyshkin et al., TRANSVERSE OR OFF-AXIS LOCALIZATION OF ELECTROMAGNETIC-WAVES IN RANDOM ONE-DIMENSIONAL AND 2-DIMENSIONAL DIELECTRIC SYSTEMS WHICH ARE PERIODIC ON AVERAGE, Waves in random media, 8(2), 1998, pp. 203-228
Citation: Jm. Elson, CHARACTERISTICS OF FAR-FIELD SCATTERING BY MEANS OF SURFACE-ROUGHNESSAND VARIATIONS IN SUBSURFACE PERMITTIVITY, Waves in random media, 7(3), 1997, pp. 303-317
Citation: Jm. Elson et P. Tran, COUPLED-MODE CALCULATION WITH THE R-MATRIX PROPAGATOR FOR THE DISPERSION OF SURFACE-WAVES ON A TRUNCATED PHOTONIC CRYSTAL, Physical review. B, Condensed matter, 54(3), 1996, pp. 1711-1715
Citation: Jm. Elson et P. Tran, DISPERSION IN PHOTONIC MEDIA AND DIFFRACTION FROM GRATINGS - A DIFFERENT MODAL EXPANSION FOR THE R-MATRIX PROPAGATION TECHNIQUE, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(8), 1995, pp. 1765-1771
Citation: Jm. Elson, MULTILAYER-COATED OPTICS - GUIDED-WAVE COUPLING AND SCATTERING BY MEANS OF INTERFACE RANDOM ROUGHNESS, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(4), 1995, pp. 729-742
Citation: Jm. Elson, THEORETICAL COMPARISON OF LIGHT-SCATTERING AND GUIDED-WAVE COUPLING IN MULTILAYER COATED OPTICAL-COMPONENTS WITH RANDOM INTERFACE ROUGHNESS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(3-4), 1995, pp. 486-493
Citation: J. Schoenwald et al., PROPAGATION OF SURFACE-POLARITONS OVER MACROSCOPIC DISTANCES AT OPTICAL FREQUENCIES (REPRINTED FROM SOLID-STATE COMMUN, VOL 12, PG 185-189,1973), Solid state communications, 88(11-12), 1993, pp. 1067-1071
Citation: Jm. Elson et al., WAVELENGTH AND ANGULAR-DEPENDENCE OF LIGHT-SCATTERING FROM BERYLLIUM - COMPARISON OF THEORY AND EXPERIMENT, Applied optics, 32(19), 1993, pp. 3362-3376