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Results: 6

Authors: TSUKAJIMA J ARAI K TAKATOH S ENOKIJIMA T HAYASHI T YIKEGAKI T KASHIWAGI A TOKUNAGA K SUZUKI T FUJIKAWA T USAMI S
Citation: J. Tsukajima et al., ELECTRON-ENERGY-LOSS FINE-STRUCTURE MEASUREMENTS OF SILICON-NITRIDE FILMS, Thin solid films, 282(1-2), 1996, pp. 318-320

Authors: HAYASHI T ARAKI K TAKATOH S ENOKIJIMA T YIKEGAKI T FUTAMI T KURIHARA Y TSUKAJIMA J TAKAMOTO K FUJIKAWA T USAMI S
Citation: T. Hayashi et al., FEASIBILITY OF REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH A SMALL SCATTERING ANGLE FOR RESEARCH IN SURFACE SCIENCE, JPN J A P 1, 34(6A), 1995, pp. 3255-3259

Authors: TAKATOH S ARAI K HAYASHI T ENOKIJIMA T YIKEGAKI T TSUKAJIMA J FUJIKAWA T USAMI S
Citation: S. Takatoh et al., CORE EXCITATION EELS STUDY ON SOME OVERLAYERS ON NI SURFACES, Physica. B, Condensed matter, 209(1-4), 1995, pp. 245-246

Authors: HAYASHI T ARAKI K TAKATOH S ENOKIJIMA T YIKEGAKI T FUTAMI T KURIHARA Y TSUKAJIMA J TAKAMOTO K FUJIKAWA T USAMI S
Citation: T. Hayashi et al., ENERGY-LOSS NEAR-EDGE STRUCTURE FOR MATERIALS CONTAINING LIGHT-ELEMENTS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Applied physics letters, 66(1), 1995, pp. 25-27

Authors: YIKEGAKI T HAYASHI T ENOKIJIMA T TAKATOH S ARAKI K TSUKAJIMA J FUJIKAWA T
Citation: T. Yikegaki et al., THEORETICAL INVESTIGATION OF EELFS FOR A DEEP CORE EXCITATION, JPN J A P 1, 32, 1993, pp. 73-75

Authors: HAYASHI T ARAKI K TAKATOH S ENOKIJIMA T YIKEGAKI T TSUKAJIMA J FUJIKAWA T USAMI S
Citation: T. Hayashi et al., ELNES MEASUREMENT FOR THE ABSORPTION OF OXYGEN ON NI(100), JPN J A P 1, 32, 1993, pp. 182-184
Risultati: 1-6 |